BibTeX record conf/aimlr/HoY23

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@inproceedings{DBLP:conf/aimlr/HoY23,
  author       = {Cheng{-}Yuan Ho and
                  Yong{-}Sheng Yang},
  title        = {Mask Defect Detection: {A} Journey through Real-World Applications
                  of CNN-based Models},
  booktitle    = {Asia Conference on Artificial Intelligence, Machine Learning and Robotics,
                  {AIMLR} 2023, Bangkok, Thailand, September 15-17, 2023},
  pages        = {2:1--2:5},
  publisher    = {{ACM}},
  year         = {2023},
  url          = {https://doi.org/10.1145/3625343.3625345},
  doi          = {10.1145/3625343.3625345},
  timestamp    = {Tue, 28 Nov 2023 20:06:30 +0100},
  biburl       = {https://dblp.org/rec/conf/aimlr/HoY23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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