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BibTeX record conf/aimech/YanCGLX23
@inproceedings{DBLP:conf/aimech/YanCGLX23, author = {Sixu Yan and Gaoming Chen and Ao Gao and Chao Liu and Zhenhua Xiong}, title = {BiSPD-YOLO: Surface Defect Detection Method for Small Features and Low-resolution Images}, booktitle = {{IEEE/ASME} International Conference on Advanced Intelligent Mechatronics, {AIM} 2023, Seattle, WA, USA, June 28-30, 2023}, pages = {709--714}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/AIM46323.2023.10196194}, doi = {10.1109/AIM46323.2023.10196194}, timestamp = {Fri, 29 Sep 2023 19:14:52 +0200}, biburl = {https://dblp.org/rec/conf/aimech/YanCGLX23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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