BibTeX record conf/aimech/YanCGLX23

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@inproceedings{DBLP:conf/aimech/YanCGLX23,
  author       = {Sixu Yan and
                  Gaoming Chen and
                  Ao Gao and
                  Chao Liu and
                  Zhenhua Xiong},
  title        = {BiSPD-YOLO: Surface Defect Detection Method for Small Features and
                  Low-resolution Images},
  booktitle    = {{IEEE/ASME} International Conference on Advanced Intelligent Mechatronics,
                  {AIM} 2023, Seattle, WA, USA, June 28-30, 2023},
  pages        = {709--714},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AIM46323.2023.10196194},
  doi          = {10.1109/AIM46323.2023.10196194},
  timestamp    = {Fri, 29 Sep 2023 19:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/aimech/YanCGLX23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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