BibTeX record conf/aimech/LiuLLSL21

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@inproceedings{DBLP:conf/aimech/LiuLLSL21,
  author       = {Ming{-}Wei Liu and
                  Yu{-}Heng Lin and
                  Yuan{-}Chieh Lo and
                  Chih{-}Hsuan Shih and
                  Pei{-}Chun Lin},
  title        = {Defect Detection of Grinded and Polished Workpieces Using Faster {R-CNN}},
  booktitle    = {{IEEE/ASME} International Conference on Advanced Intelligent Mechatronics,
                  {AIM} 2021, Delft, The Netherlands, July 12-16, 2021},
  pages        = {1290--1296},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/AIM46487.2021.9517664},
  doi          = {10.1109/AIM46487.2021.9517664},
  timestamp    = {Tue, 31 Aug 2021 10:22:22 +0200},
  biburl       = {https://dblp.org/rec/conf/aimech/LiuLLSL21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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