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BibTeX record conf/aimech/JonesC15
@inproceedings{DBLP:conf/aimech/JonesC15, author = {James C. Peyton Jones and Garrett M. Clayton}, title = {Scanning probe microscope trajectory measurement by scanning a single feature}, booktitle = {{IEEE} International Conference on Advanced Intelligent Mechatronics, {AIM} 2015, Busan, South Korea, July 7-11, 2015}, pages = {465--469}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/AIM.2015.7222577}, doi = {10.1109/AIM.2015.7222577}, timestamp = {Mon, 05 Feb 2024 20:33:44 +0100}, biburl = {https://dblp.org/rec/conf/aimech/JonesC15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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