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BibTeX record conf/aiam/ShiWZTL22
@inproceedings{DBLP:conf/aiam/ShiWZTL22, author = {Sansheng Shi and Wei Wang and Wenqi Zhi and Minzhe Tian and Mengxi Li}, title = {Development of Standard Measurement Device for 0.1Hz {VLF} Dielectric Loss Tester}, booktitle = {4th International Conference on Artificial Intelligence and Advanced Manufacturing, {AIAM} 2022, Hamburg, Germany, October 7-9, 2022}, pages = {838--841}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/AIAM57466.2022.00170}, doi = {10.1109/AIAM57466.2022.00170}, timestamp = {Tue, 11 Apr 2023 21:46:10 +0200}, biburl = {https://dblp.org/rec/conf/aiam/ShiWZTL22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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