BibTeX record conf/aiam/RenYLH22

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@inproceedings{DBLP:conf/aiam/RenYLH22,
  author       = {Leijie Ren and
                  Mingshun Yang and
                  Yirou Liu and
                  Jiali Han},
  title        = {Quality Defect Recognition Method Based on Variable Precision Rough
                  Set and Deep Belief Network},
  booktitle    = {4th International Conference on Artificial Intelligence and Advanced
                  Manufacturing, {AIAM} 2022, Hamburg, Germany, October 7-9, 2022},
  pages        = {612--615},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/AIAM57466.2022.00124},
  doi          = {10.1109/AIAM57466.2022.00124},
  timestamp    = {Tue, 11 Apr 2023 21:46:10 +0200},
  biburl       = {https://dblp.org/rec/conf/aiam/RenYLH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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