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R. D. (Shawn) Blanton

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Xin Li 0001

> Home > Persons > R. D. (Shawn) Blanton

Publications

2020
[j40]
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  - journals/tii/NguyenLBL20
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  - https://dblp.org/rec/journals/tii/NguyenLBL20
Cuong Manh Nguyen, Xin Li, Ronald DeShawn Blanton, Xiang Li:
Partial Bayesian Co-training for Virtual Metrology. IEEE Trans. Ind. Informatics 16(5): 2937-2945 (2020)
[c125]
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  dblp key:
  - conf/etfa/NguyenLBL20
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  - https://dblp.org/rec/conf/etfa/NguyenLBL20
Cuong Nguyen, Xin Li, R. D. Shawn Blanton, Xiang Li:
Efficient Classification via Partial Co-Training for Virtual Metrology. ETFA 2020: 753-760
2018
[j36]
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  - journals/tcad/XueLB18
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  - https://dblp.org/rec/journals/tcad/XueLB18
Yang Xue, Xin Li, Ronald D. Blanton:
Improving Diagnostic Resolution of Failing ICs Through Learning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(6): 1288-1297 (2018)
2017
[j34]
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  - journals/tcad/BlantonWXNXL17
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Ronald Shawn Blanton, Fa Wang, Cheng Xue, Pranab K. Nag, Yang Xue, Xin Li:
DFM Evaluation Using IC Diagnosis Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(3): 463-474 (2017)
[c101]
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  dblp key:
  - conf/etfa/NguyenLBL17
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  - https://dblp.org/rec/conf/etfa/NguyenLBL17
Cuong Nguyen, Xin Li, Ronald Shawn Blanton, Xiang Li:
Partial co-training for virtual metrology. ETFA 2017: 1-8
2016
[c90]
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  dblp key:
  - conf/itc/LimX0BA16
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  - https://dblp.org/rec/conf/itc/LimX0BA16
Carlston Lim, Yang Xue, Xin Li, Ronald D. Blanton, M. Enamul Amyeen:
Diagnostic resolution improvement through learning-guided physical failure analysis. ITC 2016: 1-10
2015
[c87]
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  - conf/iccad/BlantonLMMMPST15
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Ronald D. Blanton, Xin Li, Ken Mai, Diana Marculescu, Radu Marculescu, Jeyanandh Paramesh, Jeff G. Schneider, Donald E. Thomas:
Statistical Learning in Chip (SLIC). ICCAD 2015: 664-669
2014
[c79]
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  dblp key:
  - conf/isicir/0001BGT14
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Xin Li, Ronald Shawn Blanton, Pulkit Grover, Donald E. Thomas:
Ultra-low-power biomedical circuit design and optimization: Catching the don't cares. ISIC 2014: 115-118
[c78]
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  - conf/isicir/BlantonLMMMPST14
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Ronald D. Blanton, Xin Li, Ken Mai, Diana Marculescu, Radu Marculescu, Jeyanandh Paramesh, Jeff G. Schneider, Donald E. Thomas:
SLIC: Statistical learning in chip. ISIC 2014: 119-123
[c76]
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  - conf/itc/ZhangLBSCB14
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Shanghang Zhang, Xin Li, Ronald D. Blanton, José Machado da Silva, John M. Carulli Jr., Kenneth M. Butler:
Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. ITC 2014: 1-10
2013
[c75]
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  - conf/iccad/BlantonWXNXL13
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Ronald D. Blanton, Fa Wang, Cheng Xue, Pranab K. Nag, Yang Xue, Xin Li:
DREAMS: DFM rule EvAluation using manufactured silicon. ICCAD 2013: 99-106
[c73]
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  - conf/itc/XuePLB13
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Yang Xue, Osei Poku, Xin Li, Ronald D. Blanton:
PADRE: Physically-Aware Diagnostic Resolution Enhancement. ITC 2013: 1-10
2011
[j20]
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  - journals/tcad/ZhangLLARB11
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Wangyang Zhang, Xin Li, Frank Liu, Emrah Acar, Rob A. Rutenbar, Ronald D. Blanton:
Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(12): 1814-1827 (2011)
2009
[c60]
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  dblp key:
  - conf/iccad/LiRB09
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Xin Li, Rob A. Rutenbar, R. D. (Shawn) Blanton:
Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits. ICCAD 2009: 433-440

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