Inderpal S. Bhandari

◀ ▶ joint publications with Michael J. Halliday

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Publications

1994
[j7]
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Inderpal S. Bhandari, Michael J. Halliday, Jarir K. Chaar, Ram Chillarege, K. Jones, J. S. Atkinson, Cleo Lepori-Costello, P. Y. Jasper, E. D. Tarver, C. C. Lewis, M. Yonezawa:
In-Process Improvement through Defect Data Interpretation. IBM Syst. J. 33(1): 182-214 (1994)
[j6]
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Michael J. Halliday, Inderpal S. Bhandari, Jarir K. Chaar, Ram Chillarege:
Experiences in transferring a software process improvement methodology to production laboratories. J. Syst. Softw. 26(1): 61-68 (1994)
1993
[j5]
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Jarir K. Chaar, Michael J. Halliday, Inderpal S. Bhandari, Ram Chillarege:
In-Process Evaluation for Software Inspection and Test. IEEE Trans. Software Eng. 19(11): 1055-1070 (1993)
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Inderpal S. Bhandari, Michael J. Halliday, Eric Tarver, David Brown, Jarir K. Chaar, Ram Chillarege:
A Case Study of Software Process Improvement During Development. IEEE Trans. Software Eng. 19(12): 1157-1170 (1993)
[c5]
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Jarir K. Chaar, Michael J. Halliday, Inderpal S. Bhandari, Ram Chillarege:
On the Evaluation of Software Inspections and Tests. ITC 1993: 180-189
1992
[j3]
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Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong:
Orthogonal Defect Classification - A Concept for In-Process Measurements. IEEE Trans. Software Eng. 18(11): 943-956 (1992)

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