Kenneth M. Butler

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Jayashree Saxena

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Publications

2009
[j9]
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Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch:
Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. 26(5): 74-82 (2009)
2008
[c29]
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Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena:
Modeling Test Escape Rate as a Function of Multiple Coverages. ITC 2008: 1-9
2004
[c28]
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Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington:
Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC 2004: 355-364
2003
[c26]
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Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger:
A Case Study of IR-Drop in Structured At-Speed Testing. ITC 2003: 1098-1104
2002
[c24]
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Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech:
Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC 2002: 1120-1129
2001
[c21]
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  - conf/itc/SaxenaBW01
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Jayashree Saxena, Kenneth M. Butler, Lee Whetsel:
An analysis of power reduction techniques in scan testing. ITC 2001: 670-677
2000
[c20]
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Jayashree Saxena, Kenneth M. Butler:
An empirical study on the effects of test type ordering on overall test efficiency. ITC 2000: 408-416
[c19]
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  - conf/itc/StanojevicBWLSB00
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Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler:
Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC 2000: 729-738
1998
[c14]
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  - conf/itc/SaxenaBBLLFC98
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Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess:
On applying non-classical defect models to automated diagnosis. ITC 1998: 748-757
1997
[j2]
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Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena:
Automated Diagnosis in Testing and Failure Analysis. IEEE Des. Test Comput. 14(3): 83-89 (1997)
[c12]
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  - conf/itc/LavoLFCSB97
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David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler:
Bridging Fault Diagnosis in the Absence of Physical Information. ITC 1997: 887-893
1996
[c9]
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Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena:
Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. ITC 1996: 934

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