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Michael Nicolaidis
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Publications
- 2014
- [j32]Michael G. Dimopoulos, Yi Gang, Lorena Anghel, Mounir Benabdenbi, Nacer-Eddine Zergainoh, Michael Nicolaidis:
Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip. Microprocess. Microsystems 38(6): 620-635 (2014) - 2013
- [c113]Michael G. Dimopoulos, Yi Gang, Mounir Benabdenbi, Lorena Anghel, Nacer-Eddine Zergainoh, Michael Nicolaidis:
Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip. IOLTS 2013: 7-12 - 2012
- [j28]Vladimir Pasca, Lorena Anghel, Michael Nicolaidis, Mounir Benabdenbi:
CSL: Configurable Fault Tolerant Serial Links for Inter-die Communication in 3D Systems. J. Electron. Test. 28(1): 137-150 (2012) - [c107]Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep Kulkarni, Vivek De, Dimiter Avresky:
Design for test and reliability in ultimate CMOS. DATE 2012: 677-682 - [c106]Michael Nicolaidis, Vladimir Pasca, Lorena Anghel:
Through-silicon-via built-in self-repair for aggressive 3D integration. IOLTS 2012: 91-96 - 2011
- [c100]Hai Yu, Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh:
Efficient Fault Detection Architecture Design of Latch-Based Low Power DSP/MCU Processor. ETS 2011: 93-98 - [c99]Michael Nicolaidis, Vladimir Pasca, Lorena Anghel:
I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems. ETS 2011: 208 - [c96]Aymen Fradi, Michael Nicolaidis, Lorena Anghel:
Memory BIST with address programmability. IOLTS 2011: 79-85 - 2010
- [c93]Michael Nicolaidis, Vladimir Pasca, Lorena Anghel:
Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems. IOLTS 2010: 218 - 2009
- [c88]Hai Yu, Michael Nicolaidis, Lorena Anghel:
An effective approach to detect logic soft errors in digital circuits based on GRAAL. ISQED 2009: 236-240 - 2007
- [c81]Lorena Anghel, Michael Nicolaidis:
Defects Tolerant Logic Gates for Unreliable Future Nanotechnologies. IWANN 2007: 422-429 - 2006
- [c79]Lorena Anghel, Michael Nicolaidis, Nadine Buard:
From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately? IOLTS 2006: 85 - [c77]Lorena Anghel, Cristiano Lazzari, Michael Nicolaidis:
Multiple Defect Tolerant Devices for Unreliable Future Nanotechnologies. LATW 2006: 186-191 - 2005
- [j26]Michael Nicolaidis, Lorena Anghel, Nadir Achouri:
Memory Defect Tolerance Architectures for Nanotechnologies. J. Electron. Test. 21(4): 445-455 (2005) - [c74]Lorena Anghel, Michael Nicolaidis:
Simulation and Mitigation of Single Event Effects. IOLTS 2005: 81 - 2004
- [j25]Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis:
Simulating Single Event Transients in VDSM ICs for Ground Level Radiation. J. Electron. Test. 20(4): 413-421 (2004) - [c70]Lorena Anghel, Nadir Achouri, Michael Nicolaidis:
Evaluation of Memory Built-in Self Repair Techniques for High Defect Density Technologie. PRDC 2004: 315-320 - [c69]Michael Nicolaidis, Nadir Achouri, Lorena Anghel:
A Diversified Memory Built-In Self-Repair Approach for Nanotechnologies. VTS 2004: 313-318 - 2003
- [c67]Michael Nicolaidis, Nadir Achouri, Lorena Anghel:
A Memory Built-In Self-Repair for High Defect Densities Based on Error Polarities. DFT 2003: 459-466 - [c65]Michael Nicolaidis, Nadir Achouri, Lorena Anghel:
Memory Built-In Self-Repair for Nanotechnologies. IOLTS 2003: 94- - 2002
- [c61]Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis:
New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs. DFT 2002: 99-107 - [c59]Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis:
Simulating Single Event Transients in VDSM ICs for Ground Level Radiation. LATW 2002: 126-129 - 2000
- [c53]Lorena Anghel, Michael Nicolaidis:
Cost Reduction and Evaluation of a Temporary Faults Detecting Technique. DATE 2000: 591-598 - [c50]Lorena Anghel, Dan Alexandrescu, Michael Nicolaidis:
Evaluation of a Soft Error Tolerance Technique Based on Time and/or Space Redundancy. SBCCI 2000: 237-242 - [c49]Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal:
Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. VTS 2000: 55-66 - 1999
- [c41]Th. Calin, Lorena Anghel, Michael Nicolaidis:
Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS. VTS 1999: 135-142
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