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Alan J. Weger
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Publications
- 2018
- [c19]Franco Stellari, Alan J. Weger, Keith A. Jenkins, Giuseppe La Rosa, Barry P. Linder, Peilin Song:
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. IRPS 2018: 6 - 2015
- [c18]Andrea Bahgat Shehata, Alan J. Weger, Franco Stellari, Peilin Song, Hervé Deslandes, Ted R. Lundquist, Euan Ramsay:
Time-integrated photon emission as a function of temperature in 32 nm CMOS. IRPS 2015: 2 - [c17]Franco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song:
Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. IRPS 2015: 2 - [c16]Emily Ray, Barry P. Linder, Raphael Robertazzi, Kevin Stawiasz, Alan J. Weger, Emmanuel Yashchin, James H. Stathis, Peilin Song:
Analyzing path delays for accelerated testing of logic chips. IRPS 2015: 6 - 2014
- [c15]Franco Stellari, Peilin Song, Alan J. Weger, Jim Culp, A. Herbert, Dirk Pfeiffer:
Verification of untrusted chips using trusted layout and emission measurements. HOST 2014: 19-24 - [c14]Peilin Song, Franco Stellari, Alan J. Weger:
Counterfeit IC detection using light emission. ITC 2014: 1-8 - 2011
- [c11]Peilin Song, Franco Stellari, Dirk Pfeiffer, Jim Culp, Alan J. Weger, Alyssa Bonnoit, Bob Wisnieff, Marc Taubenblatt:
MARVEL - Malicious alteration recognition and verification by emission of light. HOST 2011: 117-121 - 2006
- [c5]Franco Stellari, Peilin Song, Tim Diemoz, Alan J. Weger, Tami Vogel, Steve Wilson, John Pennings, Richard F. Rizzolo:
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images. ITC 2006: 1-10 - 2005
- [j3]Stas Polonsky, M. Bhushan, A. Gattiker, Alan J. Weger, Peilin Song:
Photon emission microscopy of inter/intra chip device performance variations. Microelectron. Reliab. 45(9-11): 1471-1475 (2005) - [c4]Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus:
An advanced optical diagnostic technique of IBM z990 eServer microprocessor. ITC 2005: 9 - 2004
- [c2]Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia:
A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. ITC 2004: 140-147 - 2003
- [j2]Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda, Philip Wu, Steve Wilson:
Latchup Analysis Using Emission Microscopy. Microelectron. Reliab. 43(9-11): 1603-1608 (2003) - [j1]Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari:
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectron. Reliab. 43(9-11): 1663-1668 (2003) - [c1]Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda:
Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245
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