Benjamin Zeiss

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Helmut Neukirchen

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Publications

2009
[c8]
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Akhtar Ali Jalbani, Jens Grabowski, Helmut Neukirchen, Benjamin Zeiss:
Towards an Integrated Quality Assessment and Improvement Approach for UML Models. SDL Forum 2009: 63-81
2008
[j2]
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  - journals/sttt/NeukirchenZG08
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Helmut Neukirchen, Benjamin Zeiss, Jens Grabowski:
An approach to quality engineering of TTCN-3 test specifications. Int. J. Softw. Tools Technol. Transf. 10(4): 309-326 (2008)
[j1]
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Helmut Neukirchen, Benjamin Zeiss, Jens Grabowski, Paul Baker, Dominic Evans:
Quality assurance for TTCN-3 test specifications. Softw. Test. Verification Reliab. 18(2): 71-97 (2008)
2007
[c5]
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  - electronic edition @ uiuc.edu
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  - conf/ecoop/NeukirchenZ07
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Helmut Neukirchen, Benjamin Zeiss:
Automation of Refactoring and Refactoring Suggestions for TTCN-3 Test Suites. The TRex TTCN-3 Refactoring and Metrics Tool. WRT 2007: 3-4
[c4]
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  - conf/sdl/WernerGNRWZ07
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Edith Werner, Jens Grabowski, Helmut Neukirchen, Nils Röttger, Stephan Waack, Benjamin Zeiss:
TTCN-3 Quality Engineering: Using Learning Techniques to Evaluate Metric Sets. SDL Forum 2007: 54-68
[c3]
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  - conf/se/ZeissVSNG07
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Benjamin Zeiss, Diana Vega, Ina Schieferdecker, Helmut Neukirchen, Jens Grabowski:
Applying the ISO 9126 quality model to test specifications - exemplified for TTCN-3 test specifications. Software Engineering 2007: 231-242
2006
[c2]
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  - conf/sam/ZeissNGEB06
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Benjamin Zeiss, Helmut Neukirchen, Jens Grabowski, Dominic Evans, Paul Baker:
Refactoring and Metrics for TTCN-3 Test Suites. SAM 2006: 148-165
[c1]
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  - conf/taicpart/BakerEGNZ06
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Paul Baker, Dominic Evans, Jens Grabowski, Helmut Neukirchen, Benjamin Zeiss:
TRex - The Refactoring and Metrics Tool for TTCN-3 Test Specifications. TAIC PART 2006: 90-94

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