Joachim Giesen

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Bardia Sadri

> Home > Persons > Joachim Giesen

Publications

2008
[j13]
- view
  authority control:
- export record
  dblp key:
  - journals/ijcga/DeyGRS08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijcga/DeyGRS08
Tamal K. Dey, Joachim Giesen, Edgar A. Ramos, Bardia Sadri:
Critical Points of Distance to an epsilon-Sampling of a Surface and Flow-Complex-Based Surface Reconstruction. Int. J. Comput. Geom. Appl. 18(1/2): 29-61 (2008)
[j12]
- view
  authority control:
- export record
  dblp key:
  - journals/ijcga/GiesenRS08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijcga/GiesenRS08
Joachim Giesen, Edgar A. Ramos, Bardia Sadri:
Medial Axis Approximation and Unstable Flow Complex. Int. J. Comput. Geom. Appl. 18(6): 533-565 (2008)
2006
[c38]
- view
  authority control:
- export record
  dblp key:
  - conf/compgeom/GiesenRS06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/compgeom/GiesenRS06
Joachim Giesen, Edgar A. Ramos, Bardia Sadri:
Medial axis approximation and unstable flow complex. SCG 2006: 327-336
2005
[c31]
- view
  authority control:
- export record
  dblp key:
  - conf/compgeom/DeyGRS05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/compgeom/DeyGRS05
Tamal K. Dey, Joachim Giesen, Edgar A. Ramos, Bardia Sadri:
Critical points of the distance to an epsilon-sampling of a surface and flow-complex-based surface reconstruction. SCG 2005: 218-227

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.