Kees Goossens

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Zhan Gao

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Publications

2024
[j50]
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Zhan Gao, Min-Chun Hu, Rogier Baert, Bilal Chehab, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen:
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology. IEEE Des. Test 41(2): 56-64 (2024)
2021
[j44]
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Zhan Gao, Min-Chun Hu, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Erik Jan Marinissen:
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality. J. Electron. Test. 37(2): 161-189 (2021)
2020
[c140]
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Min-Chun Hu, Zhan Gao, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Cheng-Wen Wu, Erik Jan Marinissen:
Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults. ETS 2020: 1-6
2019
[c134]
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Zhan Gao, Santosh Malagi, Min-Chun Hu, Joe Swenton, Rogier Baert, Jos Huisken, Bilal Chehab, Kees Goossens, Erik Jan Marinissen:
Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library. ITC 2019: 1-6
[c133]
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  - conf/itc-asia/GaoHSMHGM19
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Zhan Gao, Min-Chun Hu, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen:
Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices. ITC-Asia 2019: 91-96
[c132]
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Zhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos Huisken, Kees Goossens:
Defect-Location Identification for Cell-Aware Test. LATS 2019: 1-6

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