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Alfredo Benso
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Publications
- 2009
- [j17]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Paolo Prinetto:
Are IEEE-1500-Compliant Cores Really Compliant to the Standard?. IEEE Des. Test Comput. 26(3): 16-24 (2009) - 2008
- [j16]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
March Test Generation Revealed. IEEE Trans. Computers 57(12): 1704-1713 (2008) - [j15]Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Yervant Zorian:
IEEE Standard 1500 Compliance Verification for Embedded Cores. IEEE Trans. Very Large Scale Integr. Syst. 16(4): 397-407 (2008) - 2007
- [c51]Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Alberto Bosio:
Automating the IEEE std.1500 compliance verification for embedded cores. HLDVT 2007: 171-178 - [c50]Mohammad Hosseinabady, Mohammad Hossein Neishaburi, Zainalabedin Navabi, Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Giorgio Di Natale:
Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC. IOLTS 2007: 205-206 - 2006
- [c49]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Memory Fault Simulator for Static-Linked Faults. ATS 2006: 31-36 - [c48]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
ATPG for Dynamic Burn-In Test in Full-Scan Circuits. ATS 2006: 75-82 - [c47]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Automatic march tests generations for static linked faults in SRAMs. DATE 2006: 1258-1263 - [c46]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs. DDECS 2006: 157-158 - [c45]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Automatic March Tests Generation for Multi-Port SRAMs. DELTA 2006: 385-392 - [c44]Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto:
Single-Event Upset Analysis and Protection in High Speed Circuits. ETS 2006: 29-34 - [c43]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
A 22n March Test for Realistic Static Linked Faults in SRAMs. ETS 2006: 49-54 - 2005
- [j14]Liviu Miclea, Szilárd Enyedi, Paolo Prinetto, Alfredo Benso:
Agent-based test and repair of distributed systems. J. Embed. Comput. 1(3): 405-414 (2005) - [j13]Andrea Baldini, Alfredo Benso, Paolo Prinetto:
System-level functional testing from UML specifications in end-of-production industrial environments. Int. J. Softw. Tools Technol. Transf. 7(4): 326-340 (2005) - [c42]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Automatic March tests generation for static and dynamic faults in SRAMs. ETS 2005: 122-127 - [c41]Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
March AB, March AB1: new March tests for unlinked dynamic memory faults. ITC 2005: 8 - [c40]Alfredo Benso, Alessandro Cilardo, Nicola Mazzocca, Liviu Miclea, Paolo Prinetto, Szilárd Enyedi:
Reconfigurable systems self-healing using mobile hardware agents. ITC 2005: 9 - 2004
- [j12]Paolo Prinetto, Alfredo Benso:
Test Technology TC Newsletter. IEEE Des. Test Comput. 21(2): 164-165 (2004) - [c39]Liviu Miclea, Szilárd Enyedi, Gavril Toderean, Alfredo Benso, Paolo Prinetto:
Towards Microagent based DBIST/DBISR. ITC 2004: 867-874 - [c38]Andrea Baldini, Alfredo Benso, Paolo Prinetto:
A Dependable Autonomic Computing Environment for Self-Testing of Complex Heterogeneous Systems. TACoS 2004: 47-57 - 2003
- [j11]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures. IEEE Commun. Mag. 41(9): 90-97 (2003) - [j10]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Online Self-Repair of FIR Filters. IEEE Des. Test Comput. 20(3): 50-57 (2003) - [j9]Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Yervant Zorian:
A Hierarchical Infrastructure for SoC Test Management. IEEE Des. Test Comput. 20(4): 32-39 (2003) - [c37]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
A Watchdog Processor to Detect Data and Control Flow Errors. IOLTS 2003: 144-148 - [c36]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, I. Solcia, Luca Tagliaferri:
FAUST: FAUlt-injection Script-based Tool. IOLTS 2003: 160 - [c35]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri:
Data Critically Estimation In Software Applications. ITC 2003: 802-810 - [c34]Liviu Miclea, Szilárd Enyedi, Gavril Toderean, Alfredo Benso, Paolo Prinetto:
Agent Based DBIST/DBISR And Its Web/Wireless Management. ITC 2003: 952-960 - 2002
- [j8]Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
DFT and BIST of a Multichip Module for High-Energy Physics Experiments. IEEE Des. Test Comput. 19(3): 94-105 (2002) - [j7]Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto:
An on-line BIST RAM architecture with self-repair capabilities. IEEE Trans. Reliab. 51(1): 123-128 (2002) - [c32]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Specification and Design of a New Memory Fault Simulator. Asian Test Symposium 2002: 92-97 - [c31]Andrea Baldini, Alfredo Benso, Paolo Prinetto, Sergio Mo, Andrea Taddei:
Beyond UML to an End-of-Line Functional Test Engine. DATE 2002: 499-503 - [c30]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
An Optimal Algorithm for the Automatic Generation of March Tests. DATE 2002: 938-943 - [c29]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Static Analysis of SEU Effects on Software Applications. ITC 2002: 500-508 - [c28]Andrea Baldini, Alfredo Benso, Paolo Prinetto, Sergio Mo, Andrea Taddei:
Efficient Design of System Test: A Layered Architecture. ITC 2002: 930-939 - 2001
- [j6]Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
Online and Offline BIST in IP-Core Design. IEEE Des. Test Comput. 18(5): 92-99 (2001) - [j5]Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
A Self-Repairing Execution Unit for Microprogrammed Processors. IEEE Micro 21(5): 16-22 (2001) - [c26]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
Memory Read Faults: Taxonomy and Automatic Test Generation. Asian Test Symposium 2001: 157-163 - [c25]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri:
Control-Flow Checking via Regular Expressions. Asian Test Symposium 2001: 299-303 - [c24]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
SEU effect analysis in an open-source router via a distributed fault injection environment. DATE 2001: 219-225 - [c23]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Luca Tagliaferri, Paolo Prinetto:
Validation of a Software Dependability Tool via Fault Injection Experiments. IOLTW 2001: 3-8 - [c22]Andrea Baldini, Alfredo Benso, Paolo Prinetto, Sergio Mo, Andrea Taddei:
Towards a unified test process: from UML to end-of-line functional test. ITC 2001: 600-608 - 2000
- [j4]Alfredo Benso, Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, Yervant Zorian:
A High-Level EDA Environment for the Automatic Insertion of HD-BIST Structures. J. Electron. Test. 16(3): 179-184 (2000) - [c21]Alfredo Benso, Silvia Chiusano, Paolo Prinetto, P. Simonotti, G. Ugo:
Self-Repairing in a Micro-Programmed Processor for Dependable Applications. DFT 2000: 231-239 - [c20]Andrea Baldini, Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
'BOND': An Interposition Agents Based Fault Injector for Windows NT. DFT 2000: 387-395 - [c19]Alfredo Benso, Silvia Chiusano, Paolo Prinetto, Luca Tagliaferri:
A C/C++ Source-to-Source Compiler for Dependable Applications. DSN 2000: 71-78 - [c18]Monica Lobetti Bodoni, Alfredo Benso, Silvia Chiusano, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
An effective distributed BIST architecture for RAMs. ETW 2000: 119-124 - [c17]Alfredo Benso, Stefano Martinetto, Paolo Prinetto, Riccardo Mariani:
An SEU Injection Tool to Evaluate DSP-Based Architectures for Space Applications. ICCD 2000: 537-538 - [c16]Alfredo Benso, Stefano Di Carlo, Silvia Chiusano, Paolo Prinetto, Fabio Ricciato, Monica Lobetti Bodoni, Maurizio Spadari:
On Integrating a Proprietary and a Commercial Architecture for Optimal BIST Performances in SoCs. ICCD 2000: 539-540 - [c15]Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
A COTS Wrapping Toolkit for Fault Tolerant Applications under Windows NT. IOLTW 2000: 9-16 - [c14]Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
A Family of Self-Repair SRAM Cores. IOLTW 2000: 214-218 - [c13]Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
A software development kit for dependable applications in embedded systems. ITC 2000: 170-178 - [c12]Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni:
A programmable BIST architecture for clusters of multiple-port SRAMs. ITC 2000: 557-566 - [c11]Alfredo Benso, Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto, Fabio Ricciato, Maurizio Spadari, Yervant Zorian:
HD2BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs. ITC 2000: 892-901 - 1999
- [j3]Stefano Barbagallo, Monica Lobetti Bodoni, Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
Testing embedded memories in telecommunication systems. IEEE Commun. Mag. 37(6): 84-89 (1999) - [c10]Alfredo Benso, Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, Yervant Zorian:
A high-level EDA environment for the automatic insertion of HD-BIST structures. ETW 1999: 2-6 - [c9]Alfredo Benso, Silvia Chiusano, Paolo Prinetto, Simone Giovannetti, Riccardo Mariani, Silvano Motto:
Testing an MCM for high-energy physics experiments: a case study. ITC 1999: 38-46 - [c8]Monica Lobetti Bodoni, Alessio Pricco, Alfredo Benso, Silvia Chiusano, Paolo Prinetto:
An on-line BISTed SRAM IP core. ITC 1999: 993-1000 - [c7]Alfredo Benso, Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, Yervant Zorian:
HD-BIST: a hierarchical framework for BIST scheduling and diagnosis in SOCs. ITC 1999: 1038-1044 - 1998
- [j1]Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda:
EXFI: a low-cost fault injection system for embedded microprocessor-based boards. ACM Trans. Design Autom. Electr. Syst. 3(4): 626-634 (1998) - [c4]Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda:
A fault injection environment for microprocessor-based boards. ITC 1998: 768-773 - 1997
- [c3]Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda, Raimund Ubar:
A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs. ED&TC 1997: 560-565 - [c2]Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda, Jaan Raik, Raimund Ubar:
Exploiting High-Level Descriptions for Circuits Fault Tolerance Assessments. DFT 1997: 212-217 - 1996
- [c1]Paolo Prinetto, Alfredo Benso, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda, Arturo M. Amendola, Leonardo Impagliazzo, P. Marmo:
Fault behavior observation of a microprocessor system through a VHDL simulation-based fault injection experiment. EURO-DAC 1996: 536-541
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