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Gilles Perrouin

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Christopher Henard

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Publications

2014
[j5]
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  - journals/tse/HenardPPKHT14
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  - https://dblp.org/rec/journals/tse/HenardPPKHT14
Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Patrick Heymans, Yves Le Traon:
Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines. IEEE Trans. Software Eng. 40(7): 650-670 (2014)
2013
[c20]
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  - conf/icse/HenardPPKT04
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  - https://dblp.org/rec/conf/icse/HenardPPKT04
Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon:
Towards automated testing and fixing of re-engineered feature models. ICSE 2013: 1245-1248
[c19]
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  - conf/icst/HenardPPKT13
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  - https://dblp.org/rec/conf/icst/HenardPPKT13
Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon:
Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing. ICST Workshops 2013: 188-197
[c18]
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  - conf/splc/HenardPPKT13
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  - https://dblp.org/rec/conf/splc/HenardPPKT13
Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon:
Multi-objective test generation for software product lines. SPLC 2013: 62-71
[c17]
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  - conf/splc/HenardPPKT13a
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  - https://dblp.org/rec/conf/splc/HenardPPKT13a
Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Yves Le Traon:
PLEDGE: a product line editor and test generation tool. SPLC Workshops 2013: 126-129
2012
[i1]
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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-1211-5451
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  - https://dblp.org/rec/journals/corr/abs-1211-5451
Christopher Henard, Mike Papadakis, Gilles Perrouin, Jacques Klein, Patrick Heymans, Yves Le Traon:
Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-wise Test Suites for Large Software Product Lines. CoRR abs/1211.5451 (2012)

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