M. Ray Mercer

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Weiping Shi

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Publications

2005
[c60]
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Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer:
An optimal test pattern selection method to improve the defect coverage. ITC 2005: 9
2003
[c56]
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Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer:
Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method. Asian Test Symposium 2003: 354-359

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