Thomas W. Williams

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with M. Ray Mercer

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Publications

2003
[c35]
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Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir:
Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects. ITC 2003: 1041-1050
2002
[c32]
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Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams:
Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC 2002: 371-374
[c31]
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Rohit Kapur, Thomas W. Williams, M. Ray Mercer:
Directed-Binary Search in Logic BIST Diagnostics. DATE 2002: 1121
[c29]
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Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams:
Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. ITC 2002: 407-416
1996
[c20]
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Thomas W. Williams, Rohit Kapur, M. Ray Mercer, Robert H. Dennard, Wojciech Maly:
Iddq Testing for High Performance CMOS - The Next Ten Years. ED&TC 1996: 578-583
[c19]
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Li-C. Wang, M. Ray Mercer, Thomas W. Williams:
A Better ATPG Algorithm and Its Design Principles. ICCD 1996: 248-253
[c18]
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Li-C. Wang, M. Ray Mercer, Thomas W. Williams:
Using Target Faults To Detect Non-Tartget Defects. ITC 1996: 629-638
[c17]
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Thomas W. Williams, Robert H. Dennard, Rohit Kapur, M. Ray Mercer, Wojciech Maly:
I_DDQ Test: Sensitivity Analysis of Scaling. ITC 1996: 786-792
1995
[c16]
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Li-C. Wang, M. Ray Mercer, Thomas W. Williams:
Enhanced testing performance via unbiased test sets. ED&TC 1995: 294-302
[c15]
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Li-C. Wang, M. Ray Mercer, Thomas W. Williams:
On Efficiently and Reliably Achieving Low Defective Part Levels. ITC 1995: 616-625
[c14]
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Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams:
On the decline of testing efficiency as fault coverage approaches 100%. VTS 1995: 74-83
1994
[c11]
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Jaehong Park, Mark Naivar, Rohit Kapur, M. Ray Mercer, Thomas W. Williams:
Limitations in predicting defect level based on stuck-at fault coverage. VTS 1994: 186-191
1992
[j8]
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Eun Sei Park, M. Ray Mercer, Thomas W. Williams:
The Total Delay Fault Model and Statistical Delay Fault Coverage. IEEE Trans. Computers 41(6): 688-698 (1992)
1991
[c9]
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Thomas W. Williams, Bill Underwood, M. Ray Mercer:
The Interdependence Between Delay-Optimization of Synthesized Networks and Testing. DAC 1991: 87-92
[c7]
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Eun Sei Park, Bill Underwood, Thomas W. Williams, M. Ray Mercer:
Delay Testing Quality in Timing-Optimized Designs. ITC 1991: 897-905
1989
[j7]
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Eun Sei Park, M. Ray Mercer, Thomas W. Williams:
A statistical model for delay-fault testing. IEEE Des. Test 6(1): 45-55 (1989)
1988
[c5]
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Eun Sei Park, Thomas W. Williams, M. Ray Mercer:
Statistical Delay Fault Coverage and Defect Level for Delay Faults. ITC 1988: 492-499

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