Stefan Holst

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Kohei Miyase

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Publications

2021
[j10]
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Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian:
On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption. IEICE Trans. Inf. Syst. 104-D(6): 816-827 (2021)
2018
[c21]
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Yucong Zhang, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Hans-Joachim Wunderlich, Jun Qian:
Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing. ATS 2018: 149-154
2017
[c19]
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Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian:
Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption. ATS 2017: 145-150
[c18]
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  - conf/itc/HolstSKKMWKW17
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Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen:
Analysis and mitigation or IR-Drop induced scan shift-errors. ITC 2017: 1-8
2016
[j8]
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  - journals/ieicet/LiWMHK16
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Fuqiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara:
Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 99-A(12): 2310-2319 (2016)
[c16]
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  - conf/ats/EggersglussHTMW16
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Stephan Eggersglüß, Stefan Holst, Daniel Tille, Kohei Miyase, Xiaoqing Wen:
Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test. ATS 2016: 173-178
2015
[c15]
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Koji Asada, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Michael A. Kochte, Eric Schneider, Hans-Joachim Wunderlich, Jun Qian:
Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding False Capture Failures and Reducing Clock Stretch. ATS 2015: 103-108
[c13]
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  - conf/ets/SyafalniSWHM15
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Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase:
A soft-error tolerant TCAM using partial don't-care keys. ETS 2015: 1-2
2014
[j6]
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  - journals/ieicet/TomitaWSKMHGTW14
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Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Kohei Miyase, Stefan Holst, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang:
On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. IEICE Trans. Inf. Syst. 97-D(10): 2706-2718 (2014)
[c12]
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  - conf/apccas/SyafalniSWHM14
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Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase:
Soft-error tolerant TCAMs for high-reliability packet classifications. APCCAS 2014: 471-474

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