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Gaudenzio Meneghesso

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Matteo Bonaiuti

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Publications

2010
[j28]
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  - journals/mr/LecceEBMZFC10
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  persistent URL:
  - https://dblp.org/rec/journals/mr/LecceEBMZFC10
Valerio Di Lecce, Michele Esposto, Matteo Bonaiuti, Gaudenzio Meneghesso, Enrico Zanoni, Fausto Fantini, Alessandro Chini:
Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress. Microelectron. Reliab. 50(9-11): 1523-1527 (2010)

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