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Sybille Hellebrand

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Matthias Kampmann

> Home > Persons > Sybille Hellebrand

Publications

2020
[c50]
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  - conf/itc/HolstKSRHWW20
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  - https://dblp.org/rec/conf/itc/HolstKSRHWW20
Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen:
Logic Fault Diagnosis of Hidden Delay Defects. ITC 2020: 1-10
2019
[j18]
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  - journals/tcad/KampmannK0SHW19
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Matthias Kampmann, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille Hellebrand, Hans-Joachim Wunderlich:
Built-In Test for Hidden Delay Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(10): 1956-1968 (2019)
2018
[j16]
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  - journals/mr/KampmannH18
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Matthias Kampmann, Sybille Hellebrand:
Design for Small Delay Test - A Simulation Study. Microelectron. Reliab. 80: 124-133 (2018)
[c47]
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  - conf/ats/0010SKHW18
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Chang Liu, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, Hans-Joachim Wunderlich:
Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. ATS 2018: 92-97
2017
[c45]
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  - conf/ddecs/KampmannH17
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Matthias Kampmann, Sybille Hellebrand:
Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. DDECS 2017: 35-41
2016
[c42]
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  - conf/ats/KampmannH16
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Matthias Kampmann, Sybille Hellebrand:
X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. ATS 2016: 1-6
2015
[c41]
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  - conf/ats/KampmannKSIHW15
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Matthias Kampmann, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, Hans-Joachim Wunderlich:
Optimized Selection of Frequencies for Faster-Than-at-Speed Test. ATS 2015: 109-114
2014
[c40]
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  - conf/itc/HellebrandIKKLW14
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Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich:
FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. ITC 2014: 1-8

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