Janusz Rajski

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Dariusz Czysz

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Publications

2013
[j60]
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Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
On Deploying Scan Chains for Data Storage in Test Compression Environment. IEEE Des. Test 30(1): 68-76 (2013)
2012
[c148]
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Dariusz Czysz, Janusz Rajski, Jerzy Tyszer:
Low power test application with selective compaction in VLSI designs. ITC 2012: 1-10
2011
[j54]
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Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki, Jerzy Tyszer:
Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(8): 1225-1238 (2011)
[c139]
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Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
Reduced ATE Interface for High Test Data Compression. ETS 2011: 99-104
2010
[j53]
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Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
On Compaction Utilizing Inter and Intra-Correlation of Unknown States. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(1): 117-126 (2010)
[c132]
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Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki, Jerzy Tyszer:
Low power compression of incompatible test cubes. ITC 2010: 704-713
2009
[j50]
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Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low-Power Scan Operation in Test Compression Environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(11): 1742-1755 (2009)
[c126]
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  - conf/itc/MrugalskiMRCT09
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Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer:
Compression based on deterministic vector clustering of incompatible test cubes. ITC 2009: 1-10
[c122]
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Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer:
Highly X-Tolerant Selective Compaction of Test Responses. VTS 2009: 245-250
2008
[j47]
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Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low-Power Test Data Application in EDT Environment Through Decompressor Freeze. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(7): 1278-1290 (2008)
[c118]
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Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low Power Scan Shift and Capture in the EDT Environment. ITC 2008: 1-10
2007
[c114]
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  - conf/dac/MrugalskiRCT07
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Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer:
New Test Data Decompressor for Low Power Applications. DAC 2007: 539-544
[c109]
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Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer:
Low Power Embedded Deterministic Test. VTS 2007: 75-83

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