Abhijit Jas

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Chandra Tirumurti

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Publications

2012
[j11]
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Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti:
Functional Test-Sequence Grading at Register-Transfer Level. IEEE Trans. Very Large Scale Integr. Syst. 20(10): 1890-1894 (2012)
2011
[j10]
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Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris:
Instruction-Level Impact Analysis of Low-Level Faults in a Modern Microprocessor Controller. IEEE Trans. Computers 60(9): 1260-1273 (2011)
[j9]
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Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Chandra Tirumurti, Yiorgos Makris:
Workload-Cognizant Concurrent Error Detection in the Scheduler of a Modern Microprocessor. IEEE Trans. Computers 60(9): 1274-1287 (2011)
[c22]
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  - conf/ets/ManiatakosTJM11
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Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris:
AVF Analysis Acceleration via Hierarchical Fault Pruning. ETS 2011: 87-92
2010
[c21]
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  - conf/cf/RossiOBMJTG10
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Daniele Rossi, Martin Omaña, Gianluca Berghella, Cecilia Metra, Abhijit Jas, Chandra Tirumurti, Rajesh Galivanche:
Low cost and low intrusive approach to test on-line the scheduler of high performance microprocessors. Conf. Computing Frontiers 2010: 113-114
2009
[c20]
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  - conf/iccd/KarimiMTJM09
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Naghmeh Karimi, Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris:
Impact analysis of performance faults in modern microprocessors. ICCD 2009: 91-96
[c19]
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  - conf/vts/ManiatakosKTJM09
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Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris:
Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller. VTS 2009: 9-14
[c18]
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  - conf/vts/FangCJPT09
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Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti:
RT-Level Deviation-Based Grading of Functional Test Sequences. VTS 2009: 264-269
2008
[c15]
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  - conf/dft/ManiatakosKMJT08
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Michail Maniatakos, Naghmeh Karimi, Yiorgos Makris, Abhijit Jas, Chandra Tirumurti:
Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller. DFT 2008: 454-462

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