Yiorgos Makris

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Ali Ahmadi

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Publications

2017
[j40]
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Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris:
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(12): 2120-2133 (2017)
[c119]
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  - conf/iscas/XanthopoulosABN17
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Constantinos Xanthopoulos, Ali Ahmadi, Sirish Boddikurapati, Amit Nahar, Bob Orr, Yiorgos Makris:
Wafer-level adaptive trim seed forecasting based on E-tests. ISCAS 2017: 1-4
2016
[c114]
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  - conf/iccad/AhmadiBNOPM16
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Ali Ahmadi, Mohammad-Mahdi Bidmeshki, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
A machine learning approach to fab-of-origin attestation. ICCAD 2016: 92
[c112]
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  - conf/iscas/AhmadiSNOPM16
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Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Harnessing fabrication process signature for predicting yield across designs. ISCAS 2016: 898-901
[c111]
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  - conf/itc/AhmadiXNOPM16
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Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Harnessing process variations for optimizing wafer-level probe-test flow. ITC 2016: 1-8
[c109]
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  - conf/vlsic/JhaAKCLYMO16
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Amit Jha, Ali Ahmadi, Sandeep Kshattry, T. Cao, K. Liao, Geoffrey Yeap, Yiorgos Makris, Kenneth K. O:
-197dBc/Hz FOM 4.3-GHz VCO Using an addressable array of minimum-sized nmos cross-coupled transistor pairs in 65-nm CMOS. VLSI Circuits 2016: 1-2
[c108]
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  - conf/vts/AhmadiNOPM16
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Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. VTS 2016: 1-6
2015
[c105]
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  - conf/iccad/AhmadiSNOPM15
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Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. ICCAD 2015: 9-14
[c104]
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  - conf/iolts/ZamanAM15
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Monir Zaman, Ali Ahmadi, Yiorgos Makris:
Workload characterization and prediction: A pathway to reliable multi-core systems. IOLTS 2015: 116-121
[c99]
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  - conf/vts/AhmadiHNOPCM15
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Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris:
Yield prognosis for fab-to-fab product migration. VTS 2015: 1-6
2014
[c96]
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  - conf/itc/AhmadiHNCM14
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Ali Ahmadi, Ke Huang, Suriyaprakash Natarajan, John M. Carulli Jr., Yiorgos Makris:
Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation. ITC 2014: 1-10

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