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Andreas Glowatz

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Will Howell

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Publications

2021
[j4]
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  dblp key:
  - journals/tcad/HapkeHMBVDGFR21
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  persistent URL:
  - https://dblp.org/rec/journals/tcad/HapkeHMBVDGFR21
Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski:
Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(3): 584-597 (2021)
2018
[c18]
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  dblp key:
  - conf/itc/HowellHBVDGRSFR18
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  persistent URL:
  - https://dblp.org/rec/conf/itc/HowellHBVDGRSFR18
Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski:
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. ITC 2018: 1-10

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