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Yixin Luo
Publications
- 2018
- [j5]Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation. Proc. ACM Meas. Anal. Comput. Syst. 2(3): 37:1-37:48 (2018) - [c12]Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
HeatWatch: Improving 3D NAND Flash Memory Device Reliability by Exploiting Self-Recovery and Temperature Awareness. HPCA 2018: 504-517 - [c10]Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation. SIGMETRICS (Abstracts) 2018: 106 - [i12]Yu Cai, Yixin Luo, Erich F. Haratsch, Ken Mai, Saugata Ghose, Onur Mutlu:
Experimental Characterization, Optimization, and Recovery of Data Retention Errors in MLC NAND Flash Memory. CoRR abs/1805.02819 (2018) - [i11]Yu Cai, Yixin Luo, Saugata Ghose, Erich F. Haratsch, Ken Mai, Onur Mutlu:
Read Disturb Errors in MLC NAND Flash Memory. CoRR abs/1805.03283 (2018) - [i10]Yu Cai, Saugata Ghose, Yixin Luo, Ken Mai, Onur Mutlu, Erich F. Haratsch:
Characterizing, Exploiting, and Mitigating Vulnerabilities in MLC NAND Flash Memory Programming. CoRR abs/1805.03291 (2018) - [i8]Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation. CoRR abs/1807.05140 (2018) - 2017
- [j3]Yu Cai, Saugata Ghose, Erich F. Haratsch, Yixin Luo, Onur Mutlu:
Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives. Proc. IEEE 105(9): 1666-1704 (2017) - [c9]Yu Cai, Saugata Ghose, Yixin Luo, Ken Mai, Onur Mutlu, Erich F. Haratsch:
Vulnerabilities in MLC NAND Flash Memory Programming: Experimental Analysis, Exploits, and Mitigation Techniques. HPCA 2017: 49-60 - [i4]Yu Cai, Saugata Ghose, Erich F. Haratsch, Yixin Luo, Onur Mutlu:
Error Characterization, Mitigation, and Recovery in Flash Memory Based Solid-State Drives. CoRR abs/1706.08642 (2017) - [i2]Yu Cai, Saugata Ghose, Erich F. Haratsch, Yixin Luo, Onur Mutlu:
Errors in Flash-Memory-Based Solid-State Drives: Analysis, Mitigation, and Recovery. CoRR abs/1711.11427 (2017) - 2016
- [j2]Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
Enabling Accurate and Practical Online Flash Channel Modeling for Modern MLC NAND Flash Memory. IEEE J. Sel. Areas Commun. 34(9): 2294-2311 (2016) - 2015
- [c7]Yu Cai, Yixin Luo, Erich F. Haratsch, Ken Mai, Onur Mutlu:
Data retention in MLC NAND flash memory: Characterization, optimization, and recovery. HPCA 2015: 551-563
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