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ORCIDK. Mehta
Publications
- 2004
[j7]George C. Giakos, Sankararaman Suryanarayanan, R. Guntupalli, J. Odogba, N. Shah, Srinivasan Vedantham
, Samir Chowdhury, K. Mehta, S. Sumrain, N. Patnekar, A. Moholkar, V. Kumar, Robert J. Endorf:
Detective quantum efficiency [DQE(0)] of CZT semiconductor detectors for digital radiography. IEEE Trans. Instrum. Meas. 53(6): 1479-1484 (2004)- 2003
- [j6]George C. Giakos, R. Guntupalli, J. Alexis De Abreu Garcia, N. Shah, Srinivasan Vedantham, Sankararaman Suryanarayanan, Samir Chowdhury, N. Patnekar, S. Sumrain, K. Mehta, Edward A. Evans, A. Orozco, V. Kumar, Okechukwu C. Ugweje, A. Moholkar:
Intrinsic sensitivity of Cd1-xZnxTe semiconductors for digital radiographic imaging. IEEE Trans. Instrum. Meas. 52(5): 1559-1565 (2003) - 2002
- [j4]George C. Giakos, Samir Chowdhury, N. Shah, K. Mehta, S. Sumrain, A. G. Passerini, N. Patnekar, Edward A. Evans, Luay Fraiwan, Okechukwu C. Ugweje, Richard Nemer:
Signal evaluation of a novel dual-energy multimedia imaging sensor. IEEE Trans. Instrum. Meas. 51(5): 949-954 (2002) - 2001
- [j3]George C. Giakos, Samir Chowdhury, N. Shah, Srinivasan Vedantham, A. G. Passerini, Sankararaman Suryanarayanan, Richard Nemer, K. Mehta, N. Patnekar, S. Sumrain, K. Nataraj, Christian Scheiber:
Signal-to-noise measurements utilizing a novel dual-energy multimedia detector. IEEE Trans. Instrum. Meas. 50(4): 910-914 (2001) - [j2]George C. Giakos, R. Guntupalli, N. Shah, Srinivasan Vedantham, Sankararaman Suryanarayanan, Samir Chowdhury, Richard Nemer, A. G. Passerini, K. Mehta, S. Sumrain, N. Patnekar, K. Nataraj, Edward A. Evans, Robert J. Endorf, Fabrizio Russo:
Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography. IEEE Trans. Instrum. Meas. 50(6): 1604-1609 (2001) - [j1]George C. Giakos, R. Guntupalli, Richard Nemer, J. Odogba, N. Shah, Srinivasan Vedantham, Sankararaman Suryanarayanan, Samir Chowdhury, A. G. Passerini, K. Mehta, S. Sumrain, N. Patnekar, K. Nataraj, Edward A. Evans, Fabrizio Russo:
Optimization of the temporal response of II-VI direct type semiconductor detectors for flat-panel pulsed X-ray imaging. IEEE Trans. Instrum. Meas. 50(6): 1610-1614 (2001)
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