Hideo Fujiwara

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Thomas Clouqueur

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Publications

2007
[j73]
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Chia Yee Ooi, Thomas Clouqueur, Hideo Fujiwara:
Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on tau^k-Notation. IEICE Trans. Inf. Syst. 90-D(8): 1202-1212 (2007)
[j69]
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Yoshiyuki Nakamura, Thomas Clouqueur, Kewal K. Saluja, Hideo Fujiwara:
Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester. IEEE Trans. Very Large Scale Integr. Syst. 15(7): 790-800 (2007)
2006
[j68]
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Yoshiyuki Nakamura, Thomas Clouqueur, Kewal K. Saluja, Hideo Fujiwara:
Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch. IEICE Trans. Inf. Syst. 89-D(3): 1165-1172 (2006)
[c99]
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Yoshiyuki Nakamura, Thomas Clouqueur, Kewal K. Saluja, Hideo Fujiwara:
Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester. ATS 2006: 409-414
2005
[j58]
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Chia Yee Ooi, Thomas Clouqueur, Hideo Fujiwara:
Classification of Sequential Circuits Based on tau^k Notation and Its Applications. IEICE Trans. Inf. Syst. 88-D(12): 2738-2747 (2005)
[c85]
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Thomas Clouqueur, Hideo Fujiwara, Kewal K. Saluja:
A Class of Linear Space Compactors for Enhanced Diagnostic. Asian Test Symposium 2005: 260-265
[c77]
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Thomas Clouqueur, Kamran Zarrineh, Kewal K. Saluja, Hideo Fujiwara:
Design and analysis of multiple weight linear compactors of responses containing unknown values. ITC 2005: 10

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