Hyunbean Yi

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Sandip Kundu

> Home > Persons > Hyunbean Yi

Publications

2010
[j7]
- view
  authority control:
- export record
  dblp key:
  - journals/tcas/YiKCP10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcas/YiKCP10
Hyunbean Yi, Sandip Kundu, Sangwook Cho, Sungju Park:
A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains. IEEE Trans. Circuits Syst. II Express Briefs 57-II(7): 561-565 (2010)
[j6]
- view
  authority control:
- export record
  dblp key:
  - journals/tcas/YiPK10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcas/YiPK10
Hyunbean Yi, Sungju Park, Sandip Kundu:
On-Chip Support for NoC-Based SoC Debugging. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(7): 1608-1617 (2010)
2008
[c8]
- view
  authority control:
- export record
  dblp key:
  - conf/ats/YiPK08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/YiPK08
Hyunbean Yi, Sungju Park, Sandip Kundu:
A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC. ATS 2008: 289-294
[c7]
- view
  authority control:
- export record
  dblp key:
  - conf/dft/YiK08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/YiK08
Hyunbean Yi, Sandip Kundu:
Core Test Wrapper Design to Reduce Test Application Time for Modular SoC Testing. DFT 2008: 412-420

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.