Wim Dehaene

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Jan Van Houdt

> Home > Persons > Wim Dehaene

Publications

2012
[j31]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/PoliakovBPMGVHD12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/PoliakovBPMGVHD12
Pavel Poliakov, Pieter Blomme, Alessandro Vaglio Pret, Miguel Corbalan Miranda, Roel Gronheid, Diederik Verkest, Jan Van Houdt, Wim Dehaene:
Trades-off between lithography line edge roughness and error-correcting codes requirements for NAND Flash memories. Microelectron. Reliab. 52(3): 525-529 (2012)
2011
[j24]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/PoliakovBCHD11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/PoliakovBCHD11
Pavel Poliakov, Pieter Blomme, Miguel Corbalan, Jan Van Houdt, Wim Dehaene:
Cross-cell interference variability aware model of fully planar NAND Flash memory including line edge roughness. Microelectron. Reliab. 51(5): 919-924 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.