Ye Chow Kuang

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Chris Chan

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Publications

2013
[j10]
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Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Huiyuan Cheng, Eric Kwang Joo Sim, Serge N. Demidenko, Chris W. K. Chan:
Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. IEEE Des. Test 30(5): 44-53 (2013)
[j9]
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Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Serge N. Demidenko, Chris Chan:
Defect cluster recognition system for fabricated semiconductor wafers. Eng. Appl. Artif. Intell. 26(3): 1029-1043 (2013)
2011
[j4]
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  - journals/tim/OoiSKDKC11
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Melanie Po-Leen Ooi, Eric Kwang Joo Sim, Ye Chow Kuang, Serge N. Demidenko, Lindsay Kleeman, Chris W. K. Chan:
Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction. IEEE Trans. Instrum. Meas. 60(10): 3300-3317 (2011)
2010
[c10]
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  - conf/delta/OoiCTKKD10
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Melanie Po-Leen Ooi, Chris Chan, Wey Jean Tee, Ye Chow Kuang, Lindsay Kleeman, Serge N. Demidenko:
Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers. DELTA 2010: 276-280
[c9]
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  - conf/delta/ChengOCKD10
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Jian Wei Cheng, Melanie Po-Leen Ooi, Chris Chan, Ye Chow Kuang, Serge N. Demidenko:
Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers. DELTA 2010: 360-366
2008
[c5]
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Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko:
Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. DELTA 2008: 216-221

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