Bozena Kaminska

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Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Karim Arabi

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Publications

2003
[c61]
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Bozena Kaminska, Karim Arabi:
Mixed Signal DFT: A Concise Overview. ICCAD 2003: 672-680
1999
[j25]
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Karim Arabi, Bozena Kaminska:
Oscillation-test methodology for low-cost testing of active analog filters. IEEE Trans. Instrum. Meas. 48(4): 798-806 (1999)
1998
[j24]
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Karim Arabi, Bozena Kaminska:
Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures. J. Electron. Test. 12(1-2): 93-99 (1998)
[j23]
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Karim Arabi, Bozena Kaminska:
Design for testability of embedded integrated operational amplifiers. IEEE J. Solid State Circuits 33(4): 573-581 (1998)
[j22]
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Karim Arabi, Bozena Kaminska, Mohamad Sawan:
On chip testing data converters using static parameters. IEEE Trans. Very Large Scale Integr. Syst. 6(3): 409-419 (1998)
[c55]
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Hassan Ihs, Karim Arabi, Bozena Kaminska:
Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation. ICCD 1998: 40-46
[c53]
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Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska:
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. ITC 1998: 91-100
1997
[j21]
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Karim Arabi, Bozena Kaminska:
Testing analog and mixed-signal integrated circuits using oscillation-test method. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(7): 745-753 (1997)
[c50]
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Karim Arabi, Bozena Kaminska:
Efficient and accurate testing of analog-to-digital converters using oscillation-test method. ED&TC 1997: 348-352
[c49]
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Karim Arabi, Bozena Kaminska:
Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures. ICCD 1997: 462-467
[c48]
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Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti:
Analog and Mixed-Signal Benchmark Circuits-First Release. ITC 1997: 183-190
[c47]
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Karim Arabi, Bozena Kaminska:
Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and I_DDQ Testing. ITC 1997: 578-586
[c45]
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Karim Arabi, Bozena Kaminska:
Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits. ITC 1997: 786-795
[c43]
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Karim Arabi, Bozena Kaminska:
Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology. VTS 1997: 166-171
1996
[j18]
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Karim Arabi, Bozena Kaminska, Janusz Rzeszut:
BIST for D/A and A/D Converters. IEEE Des. Test Comput. 13(4): 40-49 (1996)
[c41]
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Karim Arabi, Bozena Kaminska, Stephen K. Sunter:
Design for testability of integrated operational amplifiers using oscillation-test strategy. ICCD 1996: 40-45
[c38]
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Mehdi Ehsanian, Bozena Kaminska, Karim Arabi:
A new digital test approach for analog-to-digital converter testing. VTS 1996: 60-65
[c35]
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Karim Arabi, Bozena Kaminska:
Oscillation-test strategy for analog and mixed-signal integrated circuits. VTS 1996: 476-482
1994
[c20]
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Karim Arabi, Bozena Kaminska, Janusz Rzeszut:
A new built-in self-test approach for digital-to-analog and analog-to-digital converters. ICCAD 1994: 491-494

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