Andrea Baschirotto

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Christian C. Enz

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Publications

2021
[c163]
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Hung-Chi Han, Farzan Jazaeri, Antonio A. D'Amico, Andrea Baschirotto, Edoardo Charbon, Christian C. Enz:
Cryogenic Characterization of 16 nm FinFET Technology for Quantum Computing. ESSCIRC 2021: 71-74
[c160]
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Hung-Chi Han, Farzan Jazaeri, Antonio A. D'Amico, Andrea Baschirotto, Edoardo Charbon, Christian C. Enz:
Cryogenic Characterization of 16 nm FinFET Technology for Quantum Computing. ESSDERC 2021: 71-74
2018
[j58]
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  - journals/integration/RestaGMPMEB18
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Federica Resta, Simone Gerardin, S. Mattiazzo, Alessandro Paccagnella, Marcello De Matteis, Christian C. Enz, Andrea Baschirotto:
1GigaRad TID impact on 28 nm HEP analog circuits. Integr. 63: 306-314 (2018)
2017
[c125]
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  - conf/essderc/ZhangJPBBMBE17
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C.-M. Zhang, Farzan Jazaeri, Alessandro Pezzotta, Claudio Bruschini, Giulio Borghello, S. Mattiazzo, Andrea Baschirotto, Christian C. Enz:
Total ionizing dose effects on analog performance of 28 nm bulk MOSFETs. ESSDERC 2017: 30-33
[c124]
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  - conf/essderc/BeckersJRBBE17
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Arnout Beckers, Farzan Jazaeri, Andrea Ruffino, Claudio Bruschini, Andrea Baschirotto, Christian C. Enz:
Cryogenic characterization of 28 nm bulk CMOS technology for quantum computing. ESSDERC 2017: 62-65
2016
[c117]
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  - conf/essderc/PezzottaZJBBFMB16
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Alessandro Pezzotta, C.-M. Zhang, Farzan Jazaeri, Claudio Bruschini, Giulio Borghello, Federico Faccio, S. Mattiazzo, Andrea Baschirotto, Christian C. Enz:
Impact of GigaRad Ionizing Dose on 28 nm bulk MOSFETs for future HL-LHC. ESSDERC 2016: 146-149

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