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Cheng-Wen Wu
- > Home > Persons > Cheng-Wen Wu
Publications
- 2013
- [j71]Tsung-Yeh Li, Shi-Yu Huang, Hsuan-Jung Hsu, Chao-Wen Tzeng, Chih-Tsun Huang, Jing-Jia Liou, Hsi-Pin Ma, Po-Chiun Huang, Jenn-Chyou Bor, Ching-Cheng Tien, Chi-Hu Wang, Cheng-Wen Wu:
AC-Plus Scan Methodology for Small Delay Testing and Characterization. IEEE Trans. Very Large Scale Integr. Syst. 21(2): 329-341 (2013) - [j70]Jhih-Wei You, Shi-Yu Huang, Yu-Hsiang Lin, Meng-Hsiu Tsai, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu:
In-Situ Method for TSV Delay Testing and Characterization Using Input Sensitivity Analysis. IEEE Trans. Very Large Scale Integr. Syst. 21(3): 443-453 (2013) - 2011
- [c108]Chin-Fu Li, Chi-Ying Lee, Chen-Hsing Wang, Shu-Lin Chang, Li-Ming Denq, Chun-Chuan Chi, Hsuan-Jung Hsu, Ming-Yi Chu, Jing-Jia Liou, Shi-Yu Huang, Po-Chiun Huang, Hsi-Pin Ma, Jenn-Chyou Bor, Cheng-Wen Wu, Ching-Cheng Tien, Chi-Hu Wang, Yung-Sheng Kuo, Chih-Tsun Huang, Tien-Yu Chang:
A low-cost wireless interface with no external antenna and crystal oscillator for cm-range contactless testing. DAC 2011: 771-776 - 2010
- [c100]Jhih-Wei You, Shi-Yu Huang, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu:
Performance Characterization of TSV in 3D IC via Sensitivity Analysis. Asian Test Symposium 2010: 389-394 - [c96]Tsung-Yeh Li, Shi-Yu Huang, Hsuan-Jung Hsu, Chao-Wen Tzeng, Chih-Tsun Huang, Jing-Jia Liou, Hsi-Pin Ma, Po-Chiun Huang, Jenn-Chyou Bor, Cheng-Wen Wu, Ching-Cheng Tien, Mike Wang:
AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects. DFT 2010: 340-348 - 2006
- [c81]Chen-Hsing Wang, Chih-Yen Lo, Min-Sheng Lee, Jen-Chieh Yeh, Chih-Tsun Huang, Cheng-Wen Wu, Shi-Yu Huang:
A network security processor design based on an integrated SOC design and test platform. DAC 2006: 490-495 - 2003
- [j42]Hong-Chou Kao, Ming-Fu Tsai, Shi-Yu Huang, Cheng-Wen Wu, Wen-Feng Chang, Shyue-Kung Lu:
Efficient Double Fault Diagnosis for CMOS Logic Circuits With a Specific Application to Generic Bridging Faults. J. Inf. Sci. Eng. 19(4): 571-587 (2003) - [c53]Shyue-Kung Lu, Jian-Long Chen, Cheng-Wen Wu, Ken-Feng Chang, Shi-Yu Huang:
Combinational circuit fault diagnosis using logic emulation. ISCAS (5) 2003: 549-552 - 2001
- [c35]Chih-Wea Wang, Ruey-Shing Tzeng, Chi-Feng Wu, Chih-Tsun Huang, Cheng-Wen Wu, Shi-Yu Huang, Shyh-Horng Lin, Hsin-Po Wang:
A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters. Asian Test Symposium 2001: 103-
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