Stefan De Gendt

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Víctor Blanco

> Home > Persons > Stefan De Gendt

Publications

2023
[i2]
- view
  - electronic edition via DOI (open access)
  - references & citations
  authority control:
- export record
  dblp key:
  - journals/corr/abs-2308-08376
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-2308-08376
Thibault Lechien, Enrique Dehaerne, Bappaditya Dey, Víctor Blanco, Sandip Halder, Stefan De Gendt:
Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review. CoRR abs/2308.08376 (2023)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.