Bapiraju Vinnakota

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Ramesh Harjani

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Publications

2004
[c36]
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Wooyoung Choi, Bapiraju Vinnakota, Ramesh Harjani:
A digital DFT technique for verifying the static performance of A/D converters. CICC 2004: 207-210
2001
[c30]
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Wooyoung Choi, Ramesh Harjani, Bapiraju Vinnakota:
Non-ideal amplifier effects on the accuracy of analog-to-digital capacitor ratio converter. ISCAS (1) 2001: 552-555
2000
[j13]
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Bapiraju Vinnakota, Ramesh Harjani:
DFT for digital detection of analog parametric faults in SC filters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(7): 789-798 (2000)
[c28]
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Wooyoung Choi, Ramesh Harjani, Bapiraju Vinnakota:
Optimal test-set generation for parametric fault detection in switched capacitor filters. Asian Test Symposium 2000: 72-77
1999
[c24]
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Bapiraju Vinnakota, Ramesh Harjani:
Digital detection of parametric faults in data converters. CICC 1999: 151-154
[c23]
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Ramesh Harjani, Bapiraju Vinnakota:
Digital Aetection of Analog Parametric Faults in SC Filters. DAC 1999: 772-777
1997
[c16]
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Bapiraju Vinnakota, Ramesh Harjani, Wooyoung Choi:
Pseudoduplication - An ACOB Technique for Single-Ended Circuits. VLSI Design 1997: 398-402
1996
[j8]
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Nicholas J. Stessman, Bapiraju Vinnakota, Ramesh Harjani:
System-level design for test of fully differential analog circuits. IEEE J. Solid State Circuits 31(10): 1526-1534 (1996)
[c14]
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Bapiraju Vinnakota, Ramesh Harjani:
Mixed-Signal Design for Test. VLSI Design 1996: 2
1995
[c11]
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Bapiraju Vinnakota, Ramesh Harjani, Nicholas J. Stessman:
System-Level Design for Test of Fully Differential Analog Circuits. DAC 1995: 450-454
1994
[c7]
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Bapiraju Vinnakota, Ramesh Harjani:
The Design of Analog Self-Checking Circuits. VLSI Design 1994: 67-70
[c6]
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Ramesh Harjani, Bapiraju Vinnakota:
Analog circuit observer blocks. VTS 1994: 258-263

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