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Ilgu Yun
Publications
- 2015
- [j17]Edward Namkyu Cho, Yong-Hyeon Shin, Ilgu Yun:
An analytical avalanche breakdown model for double gate MOSFET. Microelectron. Reliab. 55(1): 38-41 (2015) - [j16]Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Ilgu Yun:
Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics. Microelectron. Reliab. 55(5): 795-798 (2015) - [j15]Jun Yeong Lim, Ilgu Yun:
Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices. Microelectron. Reliab. 55(9-10): 1320-1322 (2015) - 2014
- [j14]Jung Han Kang, Edward Namkyu Cho, Ilgu Yun:
Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress. Microelectron. Reliab. 54(9-10): 2164-2166 (2014) - 2013
- [j13]Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Sung-Kye Park, Ilgu Yun:
Methodology for improvement of data retention in floating gate flash memory using leakage current estimation. Microelectron. Reliab. 53(9-11): 1338-1341 (2013) - 2012
- [j12]Edward Namkyu Cho, Pyung Moon, Chang Eun Kim, Ilgu Yun:
Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm. Expert Syst. Appl. 39(10): 8885-8889 (2012) - [j10]Suehye Park, Edward Namkyu Cho, Ilgu Yun:
Threshold voltage shift prediction for gate bias stress on amorphous InGaZnO thin film transistors. Microelectron. Reliab. 52(9-10): 2215-2219 (2012) - 2011
- [j9]Chang Eun Kim, Pyung Moon, Ilgu Yun, Sungyeon Kim, Jae-Min Myoung, Hyeon Woo Jang, Jungsik Bang:
Process estimation and optimized recipes of ZnO: Ga thin film characteristics for transparent electrode applications. Expert Syst. Appl. 38(3): 2823-2827 (2011) - [j8]Edward Namkyu Cho, Jung Han Kang, Ilgu Yun:
Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors. Microelectron. Reliab. 51(9-11): 1792-1795 (2011) - 2009
- [j7]Young-Don Ko, Pyung Moon, Chang Eun Kim, Moon-Ho Ham, Jae-Min Myoung, Ilgu Yun:
Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms. Expert Syst. Appl. 36(2): 4061-4066 (2009) - 2008
- [j5]Jung Hwan Lee, Dong-Hun Kang, Young-Don Ko, Jaejin Jang, Dae-Shik Seo, Ilgu Yun:
Neural network modeling of the cellgap process for liquid crystal display fabricated on plastic substrates. Expert Syst. Appl. 35(3): 1311-1315 (2008) - 2007
- [j4]Kyoung Eun Kweon, Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun:
Neural network based modeling of HfO2 thin film characteristics using Latin Hypercube Sampling. Expert Syst. Appl. 32(2): 358-363 (2007) - [c3]Young-Don Ko, Moon-Ho Ham, Jae-Min Myoung, Ilgu Yun:
Effect of the principal component on the PCA-based neural network model for HFO2 thin film characteristics. Artificial Intelligence and Applications 2007: 255-261 - 2006
- [j2]Myoung-Seok Kim, Young-Don Ko, Tae-Houng Moon, Jae-Min Myoung, Ilgu Yun:
Modeling growth rate of HfO2 thin films grown by metal-organic molecular beam epitaxy. Microelectron. J. 37(2): 98-106 (2006) - [c2]Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun:
PCA-Based Neural Network Modeling Using the Photoluminescence Data for Growth Rate of ZnO Thin Films Fabricated by Pulsed Laser Deposition. ISNN (2) 2006: 1099-1104
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