| 2011 | ||
|---|---|---|
| j1 | Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi: A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects. IEEE Trans. on CAD of Integrated Circuits and Systems 30(11): 1719-1730 (2011) | |
| c2 | Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Krishnendu Chakrabarty: Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation. Asian Test Symposium 2011: 389-394 | |
| 2010 | ||
| c1 | S. Saqib Khursheed, Shida Zhong, Robert C. Aitken, Bashir M. Al-Hashimi, Sandip Kundu: Modeling the impact of process variation on resistive bridge defects. ITC 2010: 295-304 | |
| 1 | Robert C. Aitken (Rob Aitken) | |
| 2 | Bashir M. Al-Hashimi | |
| 3 | Krishnendu Chakrabarty | |
| 4 | S. Saqib Khursheed | |
| 5 | Sandip Kundu | |
| 6 | Sudhakar M. Reddy |
Data released under the ODC-BY 1.0 license — See also our legal information page