Thomas Zanon

Ajay Khoche, Jay Katz, Sauro Landini, Kochen Liao, Neetu Agrawal, Glenn Plowman, Song-lin Zuo, Liyang Lai, John Rowe, Thomas Zanon: STDF Memory Fail Datalog Standard. VTS 2009: 209-214

Stéphane Guérandel, Thomas Zanon, N. Castagna, F. Dahes, Emeric de Clercq, Noël Dimarcq, André Clairon: Raman-Ramsey Interaction for Coherent Population Trapping Cs Clock. IEEE T. Instrumentation and Measurement 56(2): 383-387 (2007)

Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer: Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers 23(5): 390-400 (2006)

Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton: Extraction of defect density and size distributions from wafer sort test results. DATE 2006: 913-918

Thomas Zanon, Stéphane Tremine, Stéphane Guérandel, Emeric de Clercq, David Holleville, Noël Dimarcq, André Clairon: Observation of Raman-Ramsey fringes with optical CPT pulses. IEEE T. Instrumentation and Measurement 54(2): 776-779 (2005)

Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary: Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. ITC 2004: 508-517

Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey: Deformations of IC Structure in Test and Yield Learning. ITC 2003: 856-865