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Yuta Yamato
2010 – today
- 2012
[c14]Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue: A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation. ITC 2012: 1-8- [c13]Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara: A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. VTS 2012: 197-202
- 2011
- [j6]Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara: A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing. IEICE Transactions 94-D(4): 833-840 (2011)
- [j5]Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara: Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing. IEICE Transactions 94-D(6): 1216-1226 (2011)
- [c12]Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel: Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. Asian Test Symposium 2011: 90-95
- [c11]Kohei Miyase, X. Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara: Transition-Time-Relation based capture-safety checking for at-speed scan test generation. DATE 2011: 895-898
- [c10]Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich: SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. ISLPED 2011: 33-38
- [c9]Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang: A novel scan segmentation design method for avoiding shift timing failure in scan testing. ITC 2011: 1-8
- [c8]Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor: Power-aware test generation with guaranteed launch safety for at-speed scan testing. VTS 2011: 166-171
- 2010
- [j4]Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor: High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme. IEICE Transactions 93-D(1): 2-9 (2010)
- [j3]Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja: A Study of Capture-Safe Test Generation Flow for At-Speed Testing. IEICE Transactions 93-A(7): 1309-1318 (2010)
2000 – 2009
- 2009
- [c7]Kazunari Enokimoto, Xiaoqing Wen, Yuta Yamato, Kohei Miyase, H. Sone, Seiji Kajihara, Masao Aso, Hiroshi Furukawa: CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing. Asian Test Symposium 2009: 99-104
- [c6]Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara: A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. ICCAD 2009: 97-104
- [c5]Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara: A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. PRDC 2009: 81-86
- 2008
- [j2]Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara: A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits. IEICE Transactions 91-D(3): 667-674 (2008)
- [c4]X. Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, H. Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja: A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. European Test Symposium 2008: 55-60
- [c3]Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara: Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. ICCAD 2008: 52-58
- 2007
- [c2]Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang: A novel scheme to reduce power supply noise for high-quality at-speed scan testing. ITC 2007: 1-10
- 2006
- [j1]Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita: A Per-Test Fault Diagnosis Method Based on the X-Fault Model. IEICE Transactions 89-D(11): 2756-2765 (2006)
- [c1]Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja: Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. ICCD 2006
Coauthor Index
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last updated on 2013-01-11 23:40 CET by the dblp team