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Clemens Wouters
2000 – 2009
- 2007
[c4]Paul Wielage, Erik Jan Marinissen, Michel Altheimer, Clemens Wouters: Design and DfT of a high-speed area-efficient embedded asynchronous FIFO. DATE 2007: 853-858
[c3]Tobias Dubois, Erik Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, Clemens Wouters: Test quality analysis and improvement for an embedded asynchronous FIFO. DATE 2007: 859-864- 2001
[c2]Sandeep Koranne, Tom Waayers, Robert Beurze, Clemens Wouters, Sunil Kumar, G. S. Visweswara: A P1500 Compliant Programable BistShell for Embedded Memories. MTDT 2001: 21-28
1990 – 1999
- 1999
[j1]Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff: Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. J. Electronic Testing 14(1-2): 125-131 (1999)- 1998
[c1]Erik Jan Marinissen, Robert G. J. Arendsen, Gerard Bos, Hans Dingemanse, Maurice Lousberg, Clemens Wouters: A structured and scalable mechanism for test access to embedded reusable cores. ITC 1998: 284-293
Coauthor Index
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last updated on 2012-09-10 15:52 CEST by the dblp team



