Cheol-Jong Woo

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	2011
j1		Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham: Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. J. Electronic Testing 27(4): 429-439 (2011)
	2010
c4		Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh: At-speed Test of High-Speed DUT Using Built-Off Test Interface. Asian Test Symposium 2010: 269-274
c3		Hyunjin Kim, Jaeyong Chung, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo: A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control. European Test Symposium 2010: 145-150
c2		Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo: Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. VTS 2010: 33-38
	2009
c1		Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh: Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. European Test Symposium 2009: 129-134

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