| 2003 | ||
|---|---|---|
| j7 | Gerd-Dietmar Willenberg, H. N. Tauscher, Peter Warnecke: A traceable precision current source for currents between 100 aA and 10 pA. IEEE T. Instrumentation and Measurement 52(2): 436-439 (2003) | |
| j6 | Gert Rietveld, Chris V. Koijmans, Lesley C. A. Henderson, Michael J. Hall, Stuart Harmon, Peter Warnecke, Bernd Schumacher: DC conductivity measurements in the Van der Pauw geometry. IEEE T. Instrumentation and Measurement 52(2): 449-453 (2003) | |
| j5 | Ralf Behr, Torsten Funck, Bernd Schumacher, Peter Warnecke: Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays. IEEE T. Instrumentation and Measurement 52(2): 521-523 (2003) | |
| 2001 | ||
| j4 | Ralf Behr, L. Grimm, Torsten Funck, Johannes Kohlmann, Holger Schulze, Franz Müller, Bernd Schumacher, Peter Warnecke, Jürgen Niemeyer: Application of Josephson series arrays to a DC quantum voltmeter. IEEE T. Instrumentation and Measurement 50(2): 185-187 (2001) | |
| j3 | Gerd-Dietmar Willenberg, Peter Warnecke: Stable cryogenic vacuum capacitor for single-electron charging experiments. IEEE T. Instrumentation and Measurement 50(2): 235-237 (2001) | |
| j2 | A. Satrapinski, Heikki Seppä, Bernd Schumacher, Peter Warnecke, F. Delahaye, W. Poirier, François P. M. Piquemal: Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ω resistor. IEEE T. Instrumentation and Measurement 50(2): 238-241 (2001) | |
| j1 | Bernd Schumacher, Peter Warnecke, W. Poirier, I. Delgado, Z. Msimang, Giorgio Boella, Per-Otto Hetland, Randolph E. Elmquist, Jonathan M. Williams, David Inglis, Beat Jeckelmann, Ove Gunnarsson, Alexandre Satrapinsky: Transport behavior of commercially available 100-Ω standard resistors. IEEE T. Instrumentation and Measurement 50(2): 242-244 (2001) | |
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