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 | 2007 | |
|---|---|---|
| j2 |      | Matteo Meneghini, L. Trevisanello, C. Sanna, G. Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: High temperature electro-optical degradation of InGaN/GaN HBLEDs. Microelectronics Reliability 47(9-11): 1625-1629 (2007) |
| 2006 | ||
| j1 | | Matteo Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni: High brightness GaN LEDs degradation during dc and pulsed stress. Microelectronics Reliability 46(9-11): 1720-1724 (2006) |
| 1 | Gaudenzio Meneghesso | |
| 2 | Matteo Meneghini | |
| 3 | A. Morelli | |
| 4 | G. Mura (Giovanna Mura) | |
| 5 | Ruggero Pintus | |
| 6 | Simona Podda | |
| 7 | C. Sanna | |
| 8 | Massimo Vanzi | |
| 9 | Enrico Zanoni |
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