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 | 2008 | |
|---|---|---|
| j2 |      | H. Kruggel-Emden, M. Sturm, S. Wirtz, V. Scherer: Selection of an appropriate time integration scheme for the discrete element method (DEM). Computers & Chemical Engineering 32(10): 2263-2279 (2008) |
| 1997 | ||
| j1 | | R. Schmid, R. Schmitt, M. Brunner, O. Gessner, M. Sturm: Electron Beam Probing - A Solution for MCM Test and Failure Analysis. J. Electronic Testing 10(1-2): 55-63 (1997) |
| 1984 | ||
| c1 |  | P. Küollensperger, A. Krupp, M. Sturm, R. Weyl, F. Widulla, F. Wolfgang: Automated Electron Beam Testing of VLSI Circuits. ITC 1984: 550-557 |
| 1 | M. Brunner | |
| 2 | O. Gessner | |
| 3 | H. Kruggel-Emden | |
| 4 | A. Krupp | |
| 5 | P. Küollensperger | |
| 6 | V. Scherer | |
| 7 | R. Schmid | |
| 8 | R. Schmitt | |
| 9 | R. Weyl | |
| 10 | F. Widulla | |
| 11 | S. Wirtz | |
| 12 | F. Wolfgang |
Colors in the list of coauthors
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