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B. S. Soto-Cruz

2010 – today

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2012
[j2]
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  dblp key:
  - journals/mr/CerdeiraESI12
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Antonio Cerdeira, Magali Estrada, B. S. Soto-Cruz, Benjamín Iñíguez: Modeling the behavior of amorphous oxide thin film transistors before and after bias stress. Microelectronics Reliability 52(11): 2532-2536 (2012)
2011
[j1]
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  - journals/mr/BalderramaECSMPNIPA11
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V. S. Balderrama, Magali Estrada, Antonio Cerdeira, B. S. Soto-Cruz, Lluís F. Marsal, Josep Pallarès, Jairo C. Nolasco, Benjamín Iñíguez, E. Palomares, J. Albero: Influence of P3HT: PCBM blend preparation on the active layer morphology and cell degradation. Microelectronics Reliability 51(3): 597-601 (2011)

Coauthor Index

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What is the meaning of the colors in the coauthor index?