M. van Soestbergen

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	2007
j1		M. van Soestbergen, Leo J. Ernst, Kaspar M. B. Jansen, W. D. van Driel: Measuring the through-plane elastic modulus of thin polymer films in situ. Microelectronics Reliability 47(12): 1983-1988 (2007)

Coauthor Index

1	Willem D. van Driel (W. D. van Driel)	[j1]
2	Leo J. Ernst (L. J. Ernst)	[j1]
3	Kaspar M. B. Jansen	[j1]

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