Heikki Seppä

Ville Viikari, Mikko Kantanen, Timo Varpula, Antti Lamminen, Ari Alastalo, Tomi Mattila, Heikki Seppä, Pekka Pursula, Jone Saebboe, Shi Cheng, Mustafa Al-Nuaimi, Paul Hallbjörner, Anders Rydberg: Technical Solutions for Automotive Intermodulation Radar for Detecting Vulnerable Road Users. VTC Spring 2009

Anu Kärkkäinen, Shakil A. Awan, Jukka Kyynäräinen, Panu Pekko, Aarne S. Oja, Heikki Seppä: Optimized design and process for making a DC voltage reference based on MEMS. IEEE T. Instrumentation and Measurement 54(2): 563-566 (2005)

Anu Kärkkäinen, Nadine Pesonen, Mika Suhonen, Aarne S. Oja, Antti Manninen, Nikolai Tisnek, Heikki Seppä: MEMS-based AC voltage reference. IEEE T. Instrumentation and Measurement 54(2): 595-599 (2005)

Juha Hassel, Panu Helistö, Leif Grönberg, Heikki Seppä, Jaani Nissilä, Antti Kemppinen: Stimulated power generation in ES-SIS junction arrays. IEEE T. Instrumentation and Measurement 54(2): 632-635 (2005)

Jaani Nissilä, Antti Kemppinen, Kari Ojasalo, Juha Hassel, Antti Manninen, Panu Helistö, Heikki Seppä: Realization of a square-wave voltage with externally-shunted SIS Josephson junction arrays for a quantum AC voltage standard. IEEE T. Instrumentation and Measurement 54(2): 636-640 (2005)

Panu Helistö, Heikki Seppä: Analysis of international comparisons with the minimum variance method. IEEE T. Instrumentation and Measurement 52(2): 495-499 (2003)

Jean-Pierre Lo-Hive, Sophie Djordjevic, Phillippe Cancela, François P. M. Piquemal, Ralf Behr, Charles J. Burroughs, Heikki Seppä: Characterization of binary Josephson series arrays of different types at BNM-LNE and comparisons with conventional SIS arrays. IEEE T. Instrumentation and Measurement 52(2): 516-520 (2003)

Panu Helistö, Jaani Nissilä, Kari Ojasalo, Jari S. Penttilä, Heikki Seppä: AC voltage standard based on a programmable SIS array. IEEE T. Instrumentation and Measurement 52(2): 533-537 (2003)

Juha Hassel, Heikki Seppä, Leif Grönberg, Ilkka Suni: SIS junctions with frequency dependent damping for a programmable Josephson voltage standard. IEEE T. Instrumentation and Measurement 50(2): 195-198 (2001)

A. Satrapinski, Heikki Seppä, Bernd Schumacher, Peter Warnecke, F. Delahaye, W. Poirier, François P. M. Piquemal: Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ω resistor. IEEE T. Instrumentation and Measurement 50(2): 238-241 (2001)

Heikki Seppä, Jukka Kyynäräinen, Aarne S. Oja: Microelectromechanical systems in electrical metrology. IEEE T. Instrumentation and Measurement 50(2): 440-444 (2001)

Panu Helistö, Heikki Seppä: Measurement uncertainty in the presence of low-frequency noise. IEEE T. Instrumentation and Measurement 50(2): 453-456 (2001)

Jukka Kyynäräinen, Aarne S. Oja, Heikki Seppä: Stability of microelectromechanical devices for electrical metrology. IEEE T. Instrumentation and Measurement 50(6): 1499-1503 (2001)