N. Seliger

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	2003
j5		Werner Kanert, H. Dettmer, B. Plikat, N. Seliger: Reliability aspects of semiconductor devices in high temperature applications. Microelectronics Reliability 43(9-11): 1839-1846 (2003)
j4		G. Coquery, G. Lefranc, T. Licht, Richard Lallemand, N. Seliger, H. Berg: High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC. Microelectronics Reliability 43(9-11): 1871-1876 (2003)
j3		Alberto Castellazzi, V. Kartal, R. Kraus, N. Seliger, Martin Honsberg-Riedl, Doris Schmitt-Landsiedel: Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's. Microelectronics Reliability 43(9-11): 1877-1882 (2003)
	2002
j2		N. Seliger, E. Wolfgang, G. Lefranc, H. Berg, T. Licht: Reliable power electronics for automotive applications. Microelectronics Reliability 42(9-11): 1597-1604 (2002)
j1		Alberto Castellazzi, R. Kraus, N. Seliger, Doris Schmitt-Landsiedel: Reliability analysis of power MOSFET's with the help of compact models and circuit simulation. Microelectronics Reliability 42(9-11): 1605-1610 (2002)

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