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 | 2013 | |
|---|---|---|
| j102 |      | Torsten Söderström, Liuping Wang, Rik Pintelon, Johan Schoukens: Can errors-in-variables systems be identified from closed-loop experiments? Automatica 49(2): 681-684 (2013) |
| j101 | | Anne Van Mulders, Johan Schoukens, Laurent Vanbeylen: Identification of systems with localised nonlinearity: From state-space to block-structured models. Automatica 49(5): 1392-1396 (2013) |
| j100 | | Hin Kwan Wong, Johan Schoukens, Keith R. Godfrey: Design of Multilevel Signals for Identifying the Best Linear Approximation of Nonlinear Systems. IEEE T. Instrumentation and Measurement 62(2): 519-524 (2013) |
| j99 | | Rik Pintelon, Johan Schoukens: FRF Measurement of Nonlinear Systems Operating in Closed Loop. IEEE T. Instrumentation and Measurement 62(5): 1334-1345 (2013) |
| j98 | | Johan Schoukens, Gerd Vandersteen, Rik Pintelon, Zlatko Emedi, Yves Rolain: Bounding the Polynomial Approximation Errors of Frequency Response Functions. IEEE T. Instrumentation and Measurement 62(5): 1346-1353 (2013) |
| j97 | | Egon Geerardyn, Yves Rolain, Johan Schoukens: Design of Quasi-Logarithmic Multisine Excitations for Robust Broad Frequency Band Measurements. IEEE T. Instrumentation and Measurement 62(5): 1364-1372 (2013) |
| 2012 | ||
| j96 | | J. Sjöberg, Johan Schoukens: Initializing Wiener-Hammerstein models based on partitioning of the best linear approximation. Automatica 48(2): 353-359 (2012) |
| j95 | | David Rijlaarsdam, Tom Oomen, Pieter Nuij, Johan Schoukens, Maarten Steinbuch: Uniquely connecting frequency domain representations of given order polynomial Wiener-Hammerstein systems. Automatica 48(9): 2381-2384 (2012) |
| j94 | | David T. Westwick, Johan Schoukens: Initial estimates of the linear subsystems of Wiener-Hammerstein models. Automatica 48(11): 2931-2936 (2012) |
| j93 | | Miroslav Zivanovic, Johan Schoukens: Single and Piecewise Polynomials for Modeling of Pitched Sounds. IEEE Transactions on Audio, Speech & Language Processing 20(4): 1270-1281 (2012) |
| j92 | | Hin Kwan Wong, Johan Schoukens, Keith R. Godfrey: Analysis of Best Linear Approximation of a Wiener-Hammerstein System for Arbitrary Amplitude Distributions. IEEE T. Instrumentation and Measurement 61(3): 645-654 (2012) |
| j91 | | Johan Schoukens, Gerd Vandersteen, Yves Rolain, Rik Pintelon: Frequency Response Function Measurements Using Concatenated Subrecords With Arbitrary Length. IEEE T. Instrumentation and Measurement 61(10): 2682-2688 (2012) |
| j90 | | Prasanth Thummala, Johan Schoukens: Estimation of the FRF Through the Improved Local Bandwidth Selection in the Local Polynomial Method. IEEE T. Instrumentation and Measurement 61(10): 2833-2843 (2012) |
| j89 | | Mikaya L. D. Lumori, Johan Schoukens, John Lataire: Approximate ML Estimation of the Period and Spectral Content of Multiharmonic Signals Without User Interaction. IEEE T. Instrumentation and Measurement 61(11): 2953-2959 (2012) |
| c9 | | Soma Tayamon, Torbjörn Wigren, Johan Schoukens: Convergence analysis and experiments using an RPEM based on nonlinear ODEs and midpoint integration. CDC 2012: 2858-2865 |
| c8 | | Michel Gevers, Matthias Caenepeel, Johan Schoukens: Experiment design for the identification of a simple Wiener system. CDC 2012: 7333-7338 |
| 2011 | ||
| j88 | | David Rijlaarsdam, Pieter Nuij, Johan Schoukens, Maarten Steinbuch: Spectral analysis of block structured nonlinear systems and higher order sinusoidal input describing functions. Automatica 47(12): 2684-2688 (2011) |
| j87 | | Maite Bauwens, Henrik Ohlsson, Kurt Barbé, Veerle Beelaerts, Frank Dehairs, Johan Schoukens: On climate reconstruction using bivalves: Three methods to interpret the chemical signature of a shell. Computer Methods and Programs in Biomedicine 104(2): 104-111 (2011) |
| j86 | | Miroslav Zivanovic, Johan Schoukens: On The Polynomial Approximation for Time-Variant Harmonic Signal Modeling. IEEE Transactions on Audio, Speech & Language Processing 19(3): 458-467 (2011) |
| j85 | | Benjamin Sanchez, Johan Schoukens, Ramon Bragós, Gerd Vandersteen: Novel Estimation of the Electrical Bioimpedance Using the Local Polynomial Method. Application to In Vivo Real-Time Myocardium Tissue Impedance Characterization During the Cardiac Cycle. IEEE Trans. Biomed. Engineering 58(12): 3376-3385 (2011) |
| j84 | | Kurt Barbé, Rik Pintelon, Johan Schoukens, Lieve Lauwers: Improved Variance Estimates of FRF Measurements in the Presence of Nonlinear Distortions Via Overlap. IEEE T. Instrumentation and Measurement 60(1): 300-309 (2011) |
| j83 | | Kurt Barbé, Johan Schoukens, Rik Pintelon: The Use of Nonparametric Noise Models Extracted From Overlapping Subrecords for System Identification. IEEE Transactions on Signal Processing 59(10): 4635-4647 (2011) |
| c7 | | Johan Schoukens, Yves Rolain, Gerd Vandersteen, Rik Pintelon: User friendly Box-Jenkins identification using nonparametric noise models. CDC-ECE 2011: 2148-2153 |
| c6 | | Michel Gevers, Rik Pintelon, Johan Schoukens: The Local Polynomial Method for nonparametric system identification: Improvements and experimentation. CDC-ECE 2011: 4302-4307 |
| c5 | | Koen Tiels, Johan Schoukens: Identifying a Wiener system using a variant of the Wiener G-Functionals. CDC-ECE 2011: 5780-5785 |
| c4 | | Laurent Vanbeylen, Anne Van Mulders, Johan Schoukens: A state-space view on locally-stable, globally-unstable nonlinear models driven by Gaussian burst inputs. CDC-ECE 2011: 6060-6065 |
| 2010 | ||
| j82 | | Johan Paduart, Lieve Lauwers, Jan Swevers, Kris Smolders, Johan Schoukens, Rik Pintelon: Identification of nonlinear systems using Polynomial Nonlinear State Space models. Automatica 46(4): 647-656 (2010) |
| j81 | | Torsten Söderström, Mei Hong, Johan Schoukens, Rik Pintelon: Accuracy analysis of time domain maximum likelihood method and sample maximum likelihood method for errors-in-variables and output error identification. Automatica 46(4): 721-727 (2010) |
| j80 | | Anne Van Mulders, Johan Schoukens, Marnix Volckaert, Moritz Diehl: Two nonlinear optimization methods for black box identification compared. Automatica 46(10): 1675-1681 (2010) |
| j79 | | Johan Schoukens, Tadeusz P. Dobrowiecki, Yves Rolain, Rik Pintelon: Upper Bounding Variations of Best Linear Approximations of Nonlinear Systems in Power Sweep Measurements. IEEE T. Instrumentation and Measurement 59(5): 1141-1148 (2010) |
| j78 | | Johan Schoukens, Kurt Barbé, Laurent Vanbeylen, Rik Pintelon: Nonlinear Induced Variance of Frequency Response Function Measurements. IEEE T. Instrumentation and Measurement 59(9): 2468-2474 (2010) |
| j77 | | Johan Schoukens, Rik Pintelon: Study of the Variance of Parametric Estimates of the Best Linear Approximation of Nonlinear Systems. IEEE T. Instrumentation and Measurement 59(12): 3159-3167 (2010) |
| j76 | | Kurt Barbé, Rik Pintelon, Johan Schoukens: Welch method revisited: nonparametric power spectrum estimation via circular overlap. IEEE Transactions on Signal Processing 58(2): 553-565 (2010) |
| c3 | | Johan Schoukens, Yves Rolain, Rik Pintelon: On the use of parametric and non-parametric noise-models in time- and frequency domain system identification. CDC 2010: 316-321 |
| c2 | | Tillmann Falck, Johan A. K. Suykens, Johan Schoukens, Bart De Moor: Nuclear norm regularization for overparametrized Hammerstein systems. CDC 2010: 7202-7207 |
| 2009 | ||
| j75 | | Johan Schoukens, Gerd Vandersteen, Kurt Barbé, Rik Pintelon: Nonparametric Preprocessing in System Identification: a Powerful Tool. Eur. J. Control 15(3-4): 260-274 (2009) |
| j74 | | Gerd Vandersteen, Yves Rolain, Koen Vandermot, Rik Pintelon, Johan Schoukens, Wendy Van Moer: Quasi-Analytical Bit-Error-Rate Analysis Technique Using Best Linear Approximation Modeling. IEEE T. Instrumentation and Measurement 58(2): 475-482 (2009) |
| j73 | | Johan Schoukens, John Lataire, Rik Pintelon, Gerd Vandersteen, Tadeusz P. Dobrowiecki: Robustness Issues of the Best Linear Approximation of a Nonlinear System. IEEE T. Instrumentation and Measurement 58(5): 1737-1745 (2009) |
| j72 | | Johan Schoukens, Rik Pintelon: Estimation of Nonparametric Noise Models for Linear Dynamic Systems. IEEE T. Instrumentation and Measurement 58(8): 2468-2474 (2009) |
| j71 | | Jérôme Antoni, Johan Schoukens: Optimal Settings for Measuring Frequency Response Functions With Weighted Overlapped Segment Averaging. IEEE T. Instrumentation and Measurement 58(9): 3276-3287 (2009) |
| j70 | | Laurent Vanbeylen, Rik Pintelon, Johan Schoukens: Blind maximum-likelihood identification of wiener systems. IEEE Transactions on Signal Processing 57(8): 3017-3029 (2009) |
| 2008 | ||
| j69 | | Johan Schoukens, Rik Pintelon, Martin Enqvist: Study of the LTI relations between the outputs of two coupled Wiener systems and its application to the generation of initial estimates for Wiener-Hammerstein systems. Automatica 44(7): 1654-1665 (2008) |
| j68 | | Laurent Vanbeylen, Rik Pintelon, Johan Schoukens: Blind maximum likelihood identification of Hammerstein systems. Automatica 44(12): 3139-3146 (2008) |
| j67 | | Anouk de Brauwere, Fjo De Ridder, Rik Pintelon, Jeroen Meersmans, Johan Schoukens, Frank Dehairs: Identification of a periodic time series from an environmental proxy record. Computers & Geosciences 34(12): 1781-1790 (2008) |
| j66 | | Yves Rolain, Wendy Van Moer, Johan Schoukens, Tom Dhaene: Estimation and Validation of Semiparametric Dynamic Nonlinear Models. IEEE T. Instrumentation and Measurement 57(2): 395-400 (2008) |
| j65 | | Kurt Barbé, Johan Schoukens, Rik Pintelon: Frequency-Domain, Errors-in-Variables Estimation of Linear Dynamic Systems Using Data From Overlapping Subrecords. IEEE T. Instrumentation and Measurement 57(8): 1529-1536 (2008) |
| j64 | | Johan Schoukens, Liesbeth Gommé, Wendy Van Moer, Yves Rolain: Identification of a Block-Structured Nonlinear Feedback System, Applied to a Microwave Crystal Detector. IEEE T. Instrumentation and Measurement 57(8): 1734-1740 (2008) |
| j63 | | Laurent Vanbeylen, Rik Pintelon, Johan Schoukens: Application of Blind Identification to Nonlinear Calibration. IEEE T. Instrumentation and Measurement 57(8): 1771-1778 (2008) |
| j62 | | Lieve Lauwers, Johan Schoukens, Rik Pintelon, Martin Enqvist: A Nonlinear Block Structure Identification Procedure Using Frequency Response Function Measurements. IEEE T. Instrumentation and Measurement 57(10): 2257-2264 (2008) |
| 2007 | ||
| j61 | | Rik Pintelon, Johan Schoukens: Frequency domain maximum likelihood estimation of linear dynamic errors-in-variables models. Automatica 43(4): 621-630 (2007) |
| j60 | | Rik Pintelon, Johan Schoukens, Patrick Guillaume: Box-Jenkins identification revisited - Part III: Multivariable systems. Automatica 43(5): 868-875 (2007) |
| j59 | | Johan Schoukens, Widanalage Dhammika Widanage, Keith R. Godfrey, Rik Pintelon: Initial estimates for the dynamics of a Hammerstein system. Automatica 43(7): 1296-1301 (2007) |
| j58 | | Jérôme Antoni, Johan Schoukens: A comprehensive study of the bias and variance of frequency-response-function measurements: Optimal window selection and overlapping strategies. Automatica 43(10): 1723-1736 (2007) |
| j57 | | Tadeusz P. Dobrowiecki, Johan Schoukens: Measuring a linear approximation to weakly nonlinear MIMO systems. Automatica 43(10): 1737-1751 (2007) |
| j56 | | Tadeusz P. Dobrowiecki, Johan Schoukens: Linear Approximation of Weakly Nonlinear MIMO Systems. IEEE T. Instrumentation and Measurement 56(3): 887-894 (2007) |
| j55 | | Yves Rolain, Wendy Van Moer, Johan Schoukens, Rik Pintelon: Measuring Nonlinear Differential RF Amplifiers Using One Single-Ended Source. IEEE T. Instrumentation and Measurement 56(3): 1042-1048 (2007) |
| j54 | | Johan Paduart, Johan Schoukens, Yves Rolain: Fast Measurement of Quantization Distortions in DSP Algorithms. IEEE T. Instrumentation and Measurement 56(5): 1917-1923 (2007) |
| 2006 | ||
| j53 | | Johan Schoukens, Yves Rolain, Rik Pintelon: Analysis of windowing/leakage effects in frequency response function measurements. Automatica 42(1): 27-38 (2006) |
| j52 | | Rik Pintelon, Johan Schoukens: Box-Jenkins identification revisited - Part I: Theory. Automatica 42(1): 63-75 (2006) |
| j51 | | Rik Pintelon, Yves Rolain, Johan Schoukens: Box-Jenkins identification revisited - Part II: Applications. Automatica 42(1): 77-84 (2006) |
| j50 | | Kaushik Mahata, Rik Pintelon, Johan Schoukens: On Parameter Estimation Using Nonparametric Noise Models. IEEE Trans. Automat. Contr. 51(10): 1602-1612 (2006) |
| j49 | | Tadeusz P. Dobrowiecki, Johan Schoukens, Patrick Guillaume: Optimized Excitation Signals for MIMO Frequency Response Function Measurements. IEEE T. Instrumentation and Measurement 55(6): 2072-2079 (2006) |
| j48 | | Rik Pintelon, Johan Schoukens, Patrick Guillaume: Continuous-Time Noise Modeling From Sampled Data. IEEE T. Instrumentation and Measurement 55(6): 2253-2258 (2006) |
| j47 | | Johan Schoukens, Yves Rolain, Rik Pintelon: Leakage Reduction in Frequency-Response Function Measurements. IEEE T. Instrumentation and Measurement 55(6): 2286-2291 (2006) |
| 2005 | ||
| j46 | | Johan Schoukens, Rik Pintelon, Tadeusz P. Dobrowiecki, Yves Rolain: Identification of linear systems with nonlinear distortions. Automatica 41(3): 491-504 (2005) |
| j45 | | Emad Abd-Elrady, Johan Schoukens: Least-squares periodic signal modeling using orbits of nonlinear ODEs and fully automated spectral analysis. Automatica 41(5): 857-862 (2005) |
| j44 | | Philippe Crama, Johan Schoukens: Computing an initial estimate of a Wiener-Hammerstein system with a random phase multisine excitation. IEEE T. Instrumentation and Measurement 54(1): 117-122 (2005) |
| j43 | | Fjo De Ridder, Rik Pintelon, Johan Schoukens, David Paul Gillikin: Modified AIC and MDL model selection criteria for short data records. IEEE T. Instrumentation and Measurement 54(1): 144-150 (2005) |
| j42 | | Fjo De Ridder, Rik Pintelon, Johan Schoukens, Anouk Verheyden: Reduction of the Gibbs phenomenon applied on nonharmonic time base distortions. IEEE T. Instrumentation and Measurement 54(3): 1118-1125 (2005) |
| j41 | | Tom D'haene, Rik Pintelon, Johan Schoukens, Els Van Gheem: Variance analysis of frequency response function measurements using periodic excitations. IEEE T. Instrumentation and Measurement 54(4): 1452-1456 (2005) |
| j40 | | Rik Pintelon, Johan Schoukens, Laurence Pauwels, Els Van Gheem: Diffusion systems: stability, modeling, and identification. IEEE T. Instrumentation and Measurement 54(5): 2061-2067 (2005) |
| 2004 | ||
| j39 | | Philippe Crama, Johan Schoukens, Rik Pintelon: Generation of enhanced initial estimates for Hammerstein Systems. Automatica 40(7): 1269-1273 (2004) |
| j38 | | Johan Schoukens, Tadeusz P. Dobrowiecki, Rik Pintelon: Estimation of the risk for an unstable behaviour of feedback systems in the presence of nonlinear distortions. Automatica 40(7): 1275-1279 (2004) |
| j37 | | Philippe Crama, Johan Schoukens: Hammerstein-Wiener system estimator initialization. Automatica 40(9): 1543-1550 (2004) |
| j36 | | Johan Schoukens, Rik Pintelon, Yves Rolain: Box-Jenkins alike identification using nonparametric noise models. Automatica 40(12): 2083-2089 (2004) |
| j35 | | Rik Pintelon, Johan Schoukens: Discussion on: "Identification of Multivariable Models of Fast Ferries". Eur. J. Control 10(2): 199-202 (2004) |
| j34 | | Yves Rolain, Wendy Van Moer, Gerd Vandersteen, Johan Schoukens: Why are nonlinear microwave systems measurements so involved? IEEE T. Instrumentation and Measurement 53(3): 726-729 (2004) |
| j33 | | Rik Pintelon, Gerd Vandersteen, Ludwig De Locht, Yves Rolain, Johan Schoukens: Experimental characterization of operational amplifiers: a system identification Approach-part I: theory and Simulations. IEEE T. Instrumentation and Measurement 53(3): 854-862 (2004) |
| j32 | | Rik Pintelon, Yves Rolain, Gerd Vandersteen, Johan Schoukens: Experimental characterization of operational amplifiers: a system identification approach-part II: calibration and measurements. IEEE T. Instrumentation and Measurement 53(3): 863-876 (2004) |
| j31 | | Johan Schoukens, József G. Nemeth, Gerd Vandersteen, Rik Pintelon, Philippe Crama: Linearization of nonlinear dynamic systems. IEEE T. Instrumentation and Measurement 53(4): 1245-1248 (2004) |
| 2003 | ||
| j30 | | Johan Schoukens, József G. Nemeth, Philippe Crama, Yves Rolain, Rik Pintelon: Fast approximate identification of nonlinear systems. Automatica 39(7): 1267-1274 (2003) |
| j29 | | Rik Pintelon, Johan Schoukens, Yves Rolain: Uncertainty of transfer function modelling using prior estimated noise models. Automatica 39(10): 1721-1733 (2003) |
| j28 | | Alain Geens, Yves Rolain, Wendy Van Moer, Kenneth Vanhoenacker, Johan Schoukens: Discussion on fundamental issues of NPR measurements. IEEE T. Instrumentation and Measurement 52(1): 197-202 (2003) |
| j27 | | Kenneth Vanhoenacker, Johan Schoukens: Detection of nonlinear distortions with multisine excitations in the case of nonideal behavior of the input signal. IEEE T. Instrumentation and Measurement 52(3): 748-753 (2003) |
| j26 | | Johan Schoukens, Yves Rolain, Gyula Simon, Rik Pintelon: Fully automated spectral analysis of periodic signals. IEEE T. Instrumentation and Measurement 52(4): 1021-1024 (2003) |
| 2002 | ||
| j25 | | Johan Schoukens, Yves Rolain, Rik Pintelon: Modified AIC rule for model selection in combination with prior estimated noise models. Automatica 38(5): 903-906 (2002) |
| j24 | | Rik Pintelon, Johan Schoukens: Some peculiarities of identification in the presence of model errors. Automatica 38(10): 1683-1693 (2002) |
| j23 | | Wendy Van Moer, Yves Rolain, Johan Schoukens: An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer. IEEE T. Instrumentation and Measurement 51(2): 337-341 (2002) |
| j22 | | Gyula Simon, Rik Pintelon, László Sujbert, Johan Schoukens: An efficient nonlinear least square multisine fitting algorithm. IEEE T. Instrumentation and Measurement 51(4): 750-755 (2002) |
| j21 | | József G. Nemeth, István Kollár, Johan Schoukens: Identification of Volterra kernels using interpolation. IEEE T. Instrumentation and Measurement 51(4): 770-775 (2002) |
| j20 | | Johan Schoukens, Rik Pintelon, Tadeusz P. Dobrowiecki: Linear modeling in the presence of nonlinear distortions. IEEE T. Instrumentation and Measurement 51(4): 786-792 (2002) |
| 2001 | ||
| j19 | | Johan Schoukens, Rik Pintelon, Yves Rolain, Tadeusz P. Dobrowiecki: Frequency response function measurements in the presence of nonlinear distortions. Automatica 37(6): 939-946 (2001) |
| j18 | | Tadeusz P. Dobrowiecki, Johan Schoukens: Practical choices in the FRF measurement in presence of nonlinear distortions. IEEE T. Instrumentation and Measurement 50(1): 2-7 (2001) |
| j17 | | Rik Pintelon, Johan Schoukens, Wendy Van Moer, Yves Rolain: Identification of linear systems in the presence of nonlinear distortions. IEEE T. Instrumentation and Measurement 50(4): 855-863 (2001) |
| j16 | | Kenneth Vanhoenacker, Tadeusz P. Dobrowiecki, Johan Schoukens: Design of multisine excitations to characterize the nonlinear distortions during FRF-measurements. IEEE T. Instrumentation and Measurement 50(5): 1097-1102 (2001) |
| j15 | | Balázs Vargha, Johan Schoukens, Yves Rolain: Static nonlinearity testing of digital-to-analog converters. IEEE T. Instrumentation and Measurement 50(5): 1283-1288 (2001) |
| j14 | | Gerd Vandersteen, Yves Rolain, Johan Schoukens: An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions. IEEE T. Instrumentation and Measurement 50(5): 1355-1363 (2001) |
| j13 | | Rik Pintelon, Johan Schoukens: Measurement of frequency response functions using periodic excitations, corrupted by correlated input/output errors. IEEE T. Instrumentation and Measurement 50(6): 1753-1760 (2001) |
| j12 | | Philippe Crama, Johan Schoukens: Initial estimates of Wiener and Hammerstein systems using multisine excitation. IEEE T. Instrumentation and Measurement 50(6): 1791-1795 (2001) |
| c1 | | Gerd Vandersteen, Piet Wambacq, Yves Rolain, Johan Schoukens, Stéphane Donnay, Marc Engels, Ivo Bolsens: Efficient bit-error-rate estimation of multicarrier transceivers. DATE 2001: 164-168 |
| 2000 | ||
| j11 | | Rik Pintelon, Johan Schoukens, Yves Rolain: Box-Jenkins continuous-time modeling. Automatica 36(7): 983-991 (2000) |
| j10 | | Jürgen Van Gorp, Johan Schoukens, Rik Pintelon: Learning neural networks with noisy inputs using the errors-in-variables approach. IEEE Trans. Neural Netw. Learning Syst. 11(2): 402-414 (2000) |
| 1999 | ||
| j9 | | Johan Schoukens, Rik Pintelon, Yves Rolain: Study of conditional ML estimators in time and frequency-domain system identification. Automatica 35(1): 91-100 (1999) |
| j8 | | Rik Pintelon, Johan Schoukens: Time series analysis in the frequency domain. IEEE Transactions on Signal Processing 47(1): 206-210 (1999) |
| 1997 | ||
| j7 | | Rik Pintelon, Johan Schoukens: Identification of continuous-time systems using arbitrary signals. Automatica 33(5): 991-994 (1997) |
| j6 | | Johan Schoukens, Rik Pintelon, Gerd Vandersteen, Patrick Guillaume: Frequency-domain system identification using non-parametric noise models estimated from a small number of data sets. Automatica 33(6): 1073-1086 (1997) |
| j5 | | Gerd Vandersteen, Yves Rolain, Johan Schoukens: Non-parametric Estimation of the Frequency-response Functions of the Linear Blocks of a Wiener-Hammerstein Model. Automatica 33(7): 1351-1355 (1997) |
| j4 | | Rik Pintelon, Johan Schoukens, Gerd Vandersteen: Model selection through a statistical analysis of the global minimum of a weighted nonlinear least squares cost function. IEEE Transactions on Signal Processing 45(3): 686-693 (1997) |
| 1996 | ||
| j3 | | Rudi Vuerinckx, Yves Rolain, Johan Schoukens, Rik Pintelon: Design of stable IIR filters in the complex domain by automatic delay selection. IEEE Transactions on Signal Processing 44(9): 2339-2344 (1996) |
| 1994 | ||
| j2 | | Johan Schoukens, Rik Pintelon, Hugo Van Hamme: Identification of linear dynamic systems using piecewise constant excitations: Use, misuse and alternatives. Automatica 30(7): 1153-1169 (1994) |
| 1990 | ||
| j1 | | Johan Schoukens: Modeling of continuous time systems using a discrete time representation. Automatica 26(3): 579-583 (1990) |
Colors in the list of coauthors
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